Christian Monzio Compagnoni

According to our database, Christian Monzio Compagnoni authored at least 14 papers between 2013 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Roadmap to Neuromorphic Computing with Emerging Technologies.

Adnan Mehonic, Daniele Ielmini, Kaushik Roy, Onur Mutlu, Shahar Kvatinsky, Teresa Serrano-Gotarredona, Bernabé Linares-Barranco, Sabina Spiga, Sergey Savelev, Alexander G. Balanov, Nitin Chawla, Giuseppe Desoli, Gerardo Malavena, Christian Monzio Compagnoni, Zhongrui Wang, J. Joshua Yang, Syed Ghazi Sarwat, Abu Sebastian, Thomas Mikolajick, Beatriz Noheda, Stefan Slesazeck, Bernard Dieny, Tuo-Hung Hou, Akhil Varri, Frank Brückerhoff-Plückelmann, Wolfram H. P. Pernice, Xixiang Zhang, Sebastian Pazos, Mario Lanza, Stefan Wiefels, Regina Dittmann, Wing H. Ng, Mark Buckwell, Horatio Cox, Daniel J. Mannion, Anthony J. Kenyon, Yingming Lu, Yuchao Yang, Damien Querlioz, Louis Hutin, Elisa Vianello, Sayeed Shafayet Chowdhury, Piergiulio Mannocci, Yimao Cai, Zhong Sun, Giacomo Pedretti, John Paul Strachan, Dmitri B. Strukov, Manuel Le Gallo, Stefano Ambrogio, Ilia Valov, Rainer Waser

CoRR, 2024

Investigation of the Moisture- Driven Dynamics of Time- Dependent Dielectric Breakdown in Polymeric Dielectrics for Galvanic Isolators.

M. Greatti, J. L. Mazzola, C. Monzio Compagnoni, Alessandro S. Spinelli, D. Paci, F. Speroni, V. Marano, M. Lauria, Gerardo Malavena

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention.

Mattia Giulianini, Gerardo Malavena, Luca Chiavarone, Alessandro S. Spinelli, Christian Monzio Compagnoni

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Modeling the Temperature Dependence of TDDB in Galvanic Isolators Based on Polymeric Dielectrics.

J. L. Mazzola, M. Greatti, C. Monzio Compagnoni, Alessandro S. Spinelli, V. Marano, M. Lauria, D. Paci, F. Speroni, Gerardo Malavena

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

2022

Low-current, highly linear synaptic memory device based on MoS² transistors for online training and inference.

Matteo Farronato, Margherita Melegari, Saverio Ricci, Shahin Hashemkhani, Christian Monzio Compagnoni, Daniele Ielmini

Proceedings of the 4th IEEE International Conference on Artificial Intelligence Circuits and Systems, 2022

2019

Current Transport in Polysilicon-channel GAA MOSFETs: A Modeling Perspective.

Aurelio Mannara, Alessandro S. Spinelli, Andrea L. Lacaita, Christian Monzio Compagnoni

Proceedings of the 49th European Solid-State Device Research Conference, 2019

Impact of Program Accuracy and Random Telegraph Noise on the Performance of a NOR Flash-based Neuromorphic Classifier.

Gerardo Malavena, Simone Petrò, Alessandro S. Spinelli, Christian Monzio Compagnoni

Proceedings of the 49th European Solid-State Device Research Conference, 2019

2018

Random Dopant Fluctuation and Random Telegraph Noise in Nanowire and Macaroni MOSFETs.

Alessandro S. Spinelli, Christian Monzio Compagnoni, Andrea L. Lacaita

Proceedings of the 48th European Solid-State Device Research Conference, 2018

2017

Reviewing the Evolution of the NAND Flash Technology.

Christian Monzio Compagnoni, Akira Goda, Alessandro S. Spinelli, Peter Feeley, Andrea L. Lacaita, Angelo Visconti

Proc. IEEE, 2017

Reliability of NAND Flash Memories: Planar Cells and Emerging Issues in 3D Devices.

Alessandro S. Spinelli, Christian Monzio Compagnoni, Andrea L. Lacaita

Comput., 2017

2015

Cycling pattern and read/bake conditions dependence of random telegraph noise in decananometer NAND flash arrays.

Carmine Miccoli, Giovanni M. Paolucci, Christian Monzio Compagnoni, Alessandro S. Spinelli, Akira Goda

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Cycling-induced threshold-voltage instabilities in nanoscale NAND flash memories: Sensitivity to the array background pattern.

Giovanni M. Paolucci, Massimo Ernesto Bertuccio, Christian Monzio Compagnoni, Silvia Beltrami, Alessandro S. Spinelli, Andrea L. Lacaita, Angelo Visconti

Proceedings of the 44th European Solid State Device Research Conference, 2014

Data regeneration and disturb immunity of T-RAM cells.

Halid Mulaosmanovic, Christian Monzio Compagnoni, Niccolo Castellani, Gianpietro Carnevale, Domenico Ventrice, Paolo Fantini, Alessandro S. Spinelli, Andrea L. Lacaita, Augusto Benvenuti

Proceedings of the 44th European Solid State Device Research Conference, 2014

2013

Accelerated reliability testing of flash memory: Accuracy and issues on a 45nm NOR technology.

Marcello Calabrese, Carmine Miccoli, Christian Monzio Compagnoni, Luca Chiavarone, Silvia Beltrami, Andrea Parisi, Sebastiano Bartolone, Andrea L. Lacaita, Alessandro S. Spinelli, Angelo Visconti

Proceedings of 2013 International Conference on IC Design & Technology, 2013