Christian Boit
Affiliations:- TU Berlin, Department of High-Frequency and Semiconductor System Technologies, Germany
According to our database1,
Christian Boit
authored at least 53 papers
between 2001 and 2021.
Collaborative distances:
Collaborative distances:
Timeline
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Online presence:
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on zbmath.org
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on id.loc.gov
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on dl.acm.org
On csauthors.net:
Bibliography
2021
Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities.
Proceedings of the 39th IEEE VLSI Test Symposium, 2021
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021
2019
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis.
Proceedings of the IEEE International Reliability Physics Symposium, 2019
2018
Key Extraction Using Thermal Laser Stimulation A Case Study on Xilinx Ultrascale FPGAs.
IACR Trans. Cryptogr. Hardw. Embed. Syst., 2018
Detection of failure mechanisms in 24-40 nm FinFETs with (spectral) photon emission techniques using InGaAs camera.
Microelectron. Reliab., 2018
Device characterization of 16/14 nm FinFETs for reliability assessment with infrared emission spectra.
Microelectron. Reliab., 2018
Photon emission as a characterization tool for bipolar parasitics in FinFET technology.
Microelectron. Reliab., 2018
IC security and quality improvement by protection of chip backside against hardware attacks.
Microelectron. Reliab., 2018
2017
Technologies for Heterogeneous Integration - Challenges and chances for fault isolation.
Microelectron. Reliab., 2017
On the Power of Optical Contactless Probing: Attacking Bitstream Encryption of FPGAs.
IACR Cryptol. ePrint Arch., 2017
Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017
2016
IACR Cryptol. ePrint Arch., 2016
2015
Microelectron. Reliab., 2015
A Complete and Linear Physical Characterization Methodology for the Arbiter PUF Family.
IACR Cryptol. ePrint Arch., 2015
Proceedings of the 2015 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2015
2014
Efficient and flexible Focused Ion Beam micromachining of Solid Immersion Lenses in various bulk semiconductor materials - An adaptive calibration algorithm.
Microelectron. Reliab., 2014
New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery.
Microelectron. Reliab., 2014
Microelectron. Reliab., 2014
Proceedings of the 17th Euromicro Conference on Digital System Design, 2014
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014
2013
Proceedings of the 2013 IEEE International Symposium on Hardware-Oriented Security and Trust, 2013
Proceedings of the 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2013
Proceedings of the 2013 Workshop on Fault Diagnosis and Tolerance in Cryptography, 2013
Proceedings of the 2013 ACM SIGSAC Conference on Computer and Communications Security, 2013
2012
Microelectron. Reliab., 2012
Microelectron. Reliab., 2012
Proceedings of the 2012 IEEE International Symposium on Hardware-Oriented Security and Trust, 2012
2011
Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements.
Microelectron. Reliab., 2011
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning.
Microelectron. Reliab., 2011
Microelectron. Reliab., 2011
2010
Optimizing focused ion beam created solid immersion lenses in bulk silicon using design of experiments.
Microelectron. Reliab., 2010
Microelectron. Reliab., 2010
2009
Physical analysis, trimming and editing of nanoscale IC function with backside FIB processing.
Microelectron. Reliab., 2009
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures.
Microelectron. Reliab., 2009
2008
Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits.
Microelectron. Reliab., 2008
Timing analysis of scan design integrated circuits using stimulation by an infrared diode laser in externally triggered pulsing condition.
Microelectron. Reliab., 2008
Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology.
Microelectron. Reliab., 2008
IEEE Des. Test Comput., 2008
2007
Non destructive 3D chip inspection with nano scale potential by use of backside FIB and backscattered electron microscopy.
Microelectron. Reliab., 2007
Proceedings of the 2007 IEEE International Test Conference, 2007
2006
Contact to contacts or silicide by use of backside FIB circuit edit allowing to approach every active circuit node.
Microelectron. Reliab., 2006
2005
Electrical Performance Evaluation of FIB Edited Circuits through Chip Backside Exposing Shallow Trench Isolations.
Microelectron. Reliab., 2005
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout.
Microelectron. Reliab., 2005
2004
Microelectron. Reliab., 2004
2001
Application of Scanning Probe Microscopy techniques in Semiconductor Failure Analysis.
Microelectron. Reliab., 2001
Microelectron. Reliab., 2001