Chris Schuermyer

According to our database, Chris Schuermyer authored at least 14 papers between 2002 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

Deriving Feature Fail Rate from Silicon Volume Diagnostics Data.

Shobhit Malik, Thomas Herrmann, Sriram Madhavan, Rao Desineni, Chris Schuermyer, Geir Eide

IEEE Des. Test, 2013

2012

Determining a Failure Root Cause Distribution From a Population of Layout-Aware Scan Diagnosis Results.

Brady Benware, Chris Schuermyer, Manish Sharma, Thomas Herrmann

IEEE Des. Test Comput., 2012

A Hybrid Flow for Memory Failure Bitmap Classification.

Jianbo Li, Yu Huang, Wu-Tung Cheng, Chris Schuermyer, Dong Xiang, Eric Faehn, Ruth Farrugia

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2010

Determination of Dominant-Yield-Loss Mechanism with Volume Diagnosis.

Manish Sharma, Chris Schuermyer, Brady Benware

IEEE Des. Test Comput., 2010

2007

Silicon Evaluation of Static Alternative Fault Models.

Chris Schuermyer, Jewel Pangilinan, Jay Jahangiri, Martin Keim, Janusz Rajski, Brady Benware

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2006

Extracting Defect Density and Size Distributions from Product ICs.

Jeffrey E. Nelson, Thomas Zanon, Jason G. Brown, Osei Poku, R. D. (Shawn) Blanton, Wojciech Maly, Brady Benware, Chris Schuermyer

IEEE Des. Test Comput., 2006

A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis.

Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Identification of systematic yield limiters in complex ASICS through volume structural test fail data visualization and analysis.

Chris Schuermyer, Kevin Cota, Robert Madge, Brady Benware

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Achieving higher yield through diagnosis-the ASIC perspective.

Chris Schuermyer

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Minimum Testing Requirements to Screen Temperature Dependent Defects.

Chris Schuermyer, Jens Ruffler, W. Robert Daasch

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost.

Robert Madge, Brady Benware, Ritesh P. Turakhia, W. Robert Daasch, Chris Schuermyer, Jens Ruffler

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Screening VDSM Outliers using Nominal and Subthreshold Supply Voltage IDDQ.

Chris Schuermyer, Brady Benware, Kevin Cota, Robert Madge, W. Robert Daasch, L. Ning

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Impact of Multiple-Detect Test Patterns on Product Quality.

Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Screening MinVDD Outliers Using Feed-Forward Voltage Testing.

Robert Madge, B. H. Goh, V. Rajagopalan, C. Macchietto, W. Robert Daasch, Chris Schuermyer, C. Taylor, David Turner

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002