Chris Nigh

According to our database, Chris Nigh authored at least 12 papers between 2020 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Logic-AAA: Debug of Logic Failures with an on-ATE Expert System.

Chris Nigh, Ronald D. Blanton

Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

Faulty Function Extraction for Defective Circuits.

Chris Nigh, Ruben Purdy, Wei Li, Subhasish Mitra, R. D. Shawn Blanton

Proceedings of the IEEE European Test Symposium, 2024

Silent Data Corruption: Test or Reliability Problem?

Erik Jan Marinissen, Harish Dattatraya Dixit, Ronald Shawn Blanton, Aaron Kuo, Wei Li, Subhasish Mitra, Chris Nigh, Ruben Purdy, Ben Kaczer, Dishant Sangani, Pieter Weckx, Philippe J. Roussel, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2024

2023

Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis.

Bing-Han Hsieh, Yun-Sheng Liu, James Chien-Mo Li, Chris Nigh, Mason Chern, Gaurav Bhargava

Proceedings of the IEEE International Test Conference, 2023

2022

PEPR: Pseudo-Exhaustive Physically-Aware Region Testing.

Wei Li, Chris Nigh, Danielle Duvalsaint, Subhasish Mitra, Ronald D. Blanton

Proceedings of the IEEE International Test Conference, 2022

Diagnosing Double Faulty Chains through Failing Bit Separation.

Cheng-Sian Kuo, Bing-Han Hsieh, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava, Mason Chern

Proceedings of the IEEE International Test Conference, 2022

2021

AdaTrust: Combinational Hardware Trojan Detection Through Adaptive Test Pattern Construction.

Chris Nigh, Alex Orailoglu

IEEE Trans. Very Large Scale Integr. Syst., 2021

Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization.

Mu-Ting Wu, Cheng-Sian Kuo, James Chien-Mo Li, Chris Nigh, Gaurav Bhargava

Proceedings of the IEEE International Test Conference, 2021

AAA: Automated, On-ATE AI Debug of Scan Chain Failures.

Chris Nigh, Gaurav Bhargava, Ronald D. Blanton

Proceedings of the IEEE International Test Conference, 2021

2020

Taming Combinational Trojan Detection Challenges with Self-Referencing Adaptive Test Patterns.

Chris Nigh, Alex Orailoglu

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Test Pattern Superposition to Detect Hardware Trojans.

Chris Nigh, Alex Orailoglu

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

Systematic Hold-time Fault Diagnosis and Failure Debug in Production Chips.

Chih-Yan Liu, Mu-Ting Wu, James Chien-Mo Li, Gaurav Bhargava, Chris Nigh

Proceedings of the 29th IEEE Asian Test Symposium, 2020