Chris Connor

According to our database, Chris Connor authored at least 5 papers between 2015 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability.

Yao-Feng Chang, Ilya Karpov, Reed Hopkins, David Janosky, Jacob Medeiros, Benjamin Sherrill, Jiahan Zhang, Yifu Huang, Tanmoy Pramanik, Albert B. Chen, Tony Acosta, Abdullah Guler, James A. O'Donnell, Pedro A. Quintero, Nathan Strutt, Oleg Golonzka, Chris Connor, Jack C. Lee, Jeffrey Hicks

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

eNVM RRAM reliability performance and modeling in 22FFL FinFET technology.

Yao-Feng Chang, James A. O'Donnell, Tony Acosta, Roza Kotlyar, Albert B. Chen, Pedro A. Quintero, Nathan Strutt, Oleg Golonzka, Chris Connor, Jeff Hicks

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

A 3.6Mb 10.1Mb/mm² Embedded Non-Volatile ReRAM Macro in 22nm FinFET Technology with Adaptive Forming/Set/Reset Schemes Yielding Down to 0.5V with Sensing Time of 5ns at 0.7V.

Pulkit Jain, Umut Arslan, Meenakshi Sekhar, Blake C. Lin, Liqiong Wei, Tanaya Sahu, Juan Alzate-vinasco, Ajay Vangapaty, Mesut Meterelliyoz, Nathan Strutt, Albert B. Chen, Patrick Hentges, Pedro A. Quintero, Chris Connor, Oleg Golonzka, Kevin Fischer, Fatih Hamzaoglu

Proceedings of the IEEE International Solid- State Circuits Conference, 2019

eNVM MRAM Retention Reliability Modeling in 22FFL FinFET Technology.

James A. O'Donnell, Chris Connor, Tanmoy Pramanik, Jeff Hicks, Juan G. Alzate, Fatih Hamzaoglu, Justin Brockman, Oleg Golonzka, Kevin Fischer

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2015

Outlier detection for large scale manufacturing processes.

Abhinav Jauhri, Bradley McDanel, Chris Connor

Proceedings of the 2015 IEEE International Conference on Big Data (IEEE BigData 2015), Santa Clara, CA, USA, October 29, 2015