Chris Chan

According to our database, Chris Chan authored at least 10 papers between 2008 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Foundational Models for Malware Embeddings Using Spatio-Temporal Parallel Convolutional Networks.

Dhruv Nandakumar, Devin Quinn, Elijah Soba, Eunyoung Kim, Christopher Redino, Chris Chan, Kevin Choi, Abdul Rahman, Edward Bowen

Proceedings of the International Conference on Computing, Networking and Communications, 2024

2017

Subjective perception of wind turbine noise - The stereo approach.

Steven Edwin Cooper, Chris Chan

Proc. Meet. Acoust., 2017

2014

A Serious Game for Medical-Based Cultural Competence Education and Training.

Mirza Beig, Alex Mayer, Chris Chan, Bill Kapralos, Adam Dubrowski

Proceedings of the IEEE 14th International Conference on Advanced Learning Technologies, 2014

2013

Defect cluster recognition system for fabricated semiconductor wafers.

Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Serge N. Demidenko, Chris Chan

Eng. Appl. Artif. Intell., 2013

Identifying Systematic Failures on Semiconductor Wafers Using ADCAS.

Melanie Po-Leen Ooi, Hong Kuan Sok, Ye Chow Kuang, Huiyuan Cheng, Eric Kwang Joo Sim, Serge N. Demidenko, Chris W. K. Chan

IEEE Des. Test, 2013

2011

Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction.

Melanie Po-Leen Ooi, Eric Kwang Joo Sim, Ye Chow Kuang, Serge N. Demidenko, Lindsay Kleeman, Chris W. K. Chan

IEEE Trans. Instrum. Meas., 2011

2-Factor Authentication with 2D Barcodes.

Luke Hebbes, Chris Chan

Proceedings of the 5th International Symposium on Human Aspects of Information Security and Assurance, 2011

2010

Fast and Accurate Automatic Defect CLuster Extraction for Semiconductor Wafers.

Melanie Po-Leen Ooi, Chris Chan, Wey Jean Tee, Ye Chow Kuang, Lindsay Kleeman, Serge N. Demidenko

Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

Evaluating the Performance of Different Classification Algorithms for Fabricated Semiconductor Wafers.

Jian Wei Cheng, Melanie Po-Leen Ooi, Chris Chan, Ye Chow Kuang, Serge N. Demidenko

Proceedings of the Fifth IEEE International Symposium on Electronic Design, 2010

2008

Predictive Die-Level Reliability-Yield Modeling for Deep Sub-micron Devices.

Melanie Po-Leen Ooi, Ye Chow Kuang, Chris Chan, Serge N. Demidenko

Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008