Chinsung Park
According to our database1,
Chinsung Park
authored at least 2 papers
in 2024.
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Bibliography
2024
Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors Under Bipolar Stress Conditions.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Design Framework for Ferroelectric Gate Stack Engineering of Vertical NAND Structures for Efficient TLC and QLC Operation.
Proceedings of the IEEE International Memory Workshop, 2024