Ching-Yuan Chen

Orcid: 0000-0001-7605-8821

According to our database1, Ching-Yuan Chen authored at least 16 papers between 2019 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2024
Mitigating Slow-to-Write Errors in Memristor-Mapped Graph Neural Networks Induced by Adversarial Attacks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., August, 2024

Context-Aware Replanning with Pre-explored Semantic Map for Object Navigation.
CoRR, 2024

Benchmarking Cognitive Domains for LLMs: Insights from Taiwanese Hakka Culture.
CoRR, 2024

2023
Functional Test Generation for AI Accelerators using Bayesian Optimization<sup>∗</sup>.
Proceedings of the 41st IEEE VLSI Test Symposium, 2023

Attacking Memristor-Mapped Graph Neural Network by Inducing Slow-to-Write Errors.
Proceedings of the IEEE European Test Symposium, 2023

2022
Efficient Identification of Critical Faults in Memristor-Based Inferencing Accelerators.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2021
Design of a Bone-Guided Cochlear Implant Microsystem With Monopolar Biphasic Multiple Stimulations and Evoked Compound Action Potential Acquisition and Its In Vivo Verification.
IEEE J. Solid State Circuits, 2021

On-line Functional Testing of Memristor-mapped Deep Neural Networks using Backdoored Checksums.
Proceedings of the IEEE International Test Conference, 2021

Efficient Fault-Criticality Analysis for AI Accelerators using a Neural Twin<sup>∗</sup>.
Proceedings of the IEEE International Test Conference, 2021

Efficient Identification of Critical Faults in Memristor Crossbars for Deep Neural Networks.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2021

Pruning of Deep Neural Networks for Fault-Tolerant Memristor-based Accelerators.
Proceedings of the 58th ACM/IEEE Design Automation Conference, 2021

2020
Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model.
Proceedings of the IEEE European Test Symposium, 2020

Improved Design and In Vivo Animal Tests of Bone-Guided Cochlear Implant Microsystem with Monopolar Biphasic Multiple Stimulation and Neural Action Potential Acquisition.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2020

2019
Potential Usefulness of Single Photon Emission Computed Tomography/Computed Tomography in Management of Patients with Failed Back Surgery Syndrome.
J. Medical Imaging Health Informatics, 2019

Testability Measures Considering Circuit Reconvergence to Reduce ATPG Runtime.
Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019

Reinforcement-Learning-Based Test Program Generation for Software-Based Self-Test.
Proceedings of the 28th IEEE Asian Test Symposium, 2019


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