Chin-Lung Su

According to our database, Chin-Lung Su authored at least 12 papers between 2003 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2015

Testing methods for quaternary content addressable memory using charge-sharing sensing scheme.

Hao-Yu Yang, Rei-Fu Huang, Chin-Lung Su, Kuan-Hong Lin, Hang-Kaung Shu, Chi-Wei Peng, Mango Chia-Tso Chao

Proceedings of the 2015 IEEE International Test Conference, 2015

2013

Generalization of an Enhanced ECC Methodology for Low Power PSRAM.

Po-Yuan Chen, Chin-Lung Su, Chao-Hsun Chen, Cheng-Wen Wu

IEEE Trans. Computers, 2013

2011

A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories.

Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Kun-Lun Luo, Wen Ching Wu

IEEE Trans. Very Large Scale Integr. Syst., 2011

2010

Diagnosis of MRAM Write Disturbance Fault.

Chin-Lung Su, Chih-Wea Tsai, Ching-Yi Chen, Wan-Yu Lo, Cheng-Wen Wu, Ji-Jan Chen, Wen Ching Wu, Chien-Chung Hung, Ming-Jer Kao

IEEE Trans. Very Large Scale Integr. Syst., 2010

2008

Write Disturbance Modeling and Testing for MRAM.

Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ding-Yeong Wang, Yuan-Jen Lee, Ming-Jer Kao

IEEE Trans. Very Large Scale Integr. Syst., 2008

Test and Diagnosis Algorithm Generation and Evaluation for MRAM Write Disturbance Fault.

Wan-Yu Lo, Ching-Yi Chen, Chin-Lung Su, Cheng-Wen Wu

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Diagnosis for MRAM write disturbance fault.

Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Ji-Jan Chen, Wen Ching Wu, Chien-Chung Hung, Ming-Jer Kao

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

Testing MRAM for Write Disturbance Fault.

Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ming-Jer Kao

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

An Integrated ECC and Redundancy Repair Scheme for Memory Reliability Enhancement.

Chin-Lung Su, Yi-Ting Yeh, Cheng-Wen Wu

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

2004

MRAM Defect Analysis and Fault Modeli.

Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Fail Pattern Identification for Memory Built-In Self-Repair.

Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2003

A Processor-Based Built-In Self-Repair Design for Embedded Memories.

Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003