Chin Hu Ong

According to our database, Chin Hu Ong authored at least 2 papers between 2007 and 2008.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2008

Diagnosis of Voltage Dependent Scan Chain Failure Using VBUMP Scan Debug Method.

Khairul Khusyari, Wei Tee Ng, Neal Jaarsma, Robert Abraham, Peng Weng Ng, Boon Hui Ang, Chin Hu Ong

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

IDDQ Test Challenges in Nanotechnologies: A Manufacturing Test Strategy.

Yu Wei P'ng, Moo Kit Lee, Peng Weng Ng, Chin Hu Ong

Proceedings of the 16th Asian Test Symposium, 2007