Chih-Min Fan

According to our database, Chih-Min Fan authored at least 3 papers between 2008 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

A novel ontology-based knowledge engineering approach for yield symptom identification in semiconductor manufacturing.

Fang-Hsiang Su, Shi-Chung Chang, Chih-Min Fan, Ya-Jung Tsai, J. Jheng, Ching-Pin Kao, Chun-Yao Lu

Proceedings of the IEEE Conference on Automation Science and Engineering, 2009

A Bayesian Ranking Scheme for supporting cost-effective yield diagnosis services.

Chih-Min Fan, Yun-Pei Lu

Proceedings of the IEEE Conference on Automation Science and Engineering, 2009

2008

A Bayesian framework to integrate knowledge-based and data-driven inference tools for reliable yield diagnoses.

Chih-Min Fan, Yun-Pei Lu

Proceedings of the 2008 Winter Simulation Conference, Global Gateway to Discovery, 2008