Chih-Hong Hwang

According to our database, Chih-Hong Hwang authored at least 6 papers between 2007 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Device and circuit level suppression techniques for random-dopant-induced static noise margin fluctuation in 16-nm-gate SRAM cell.

Kuo-Fu Lee, Yiming Li, Tien-Yeh Li, Zhong-Cheng Su, Chin-Hong Hwang

Microelectron. Reliab., 2010

Statistical variability in FinFET devices with intrinsic parameter fluctuations.

Chih-Hong Hwang, Yiming Li, Ming-Hung Han

Microelectron. Reliab., 2010

The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit.

Ming-Hung Han, Yiming Li, Chih-Hong Hwang

Microelectron. Reliab., 2010

2009

Discrete-Dopant-Induced Timing Fluctuation and Suppression in Nanoscale CMOS Circuit.

Yiming Li, Chih-Hong Hwang, Tien-Yeh Li

IEEE Trans. Circuits Syst. II Express Briefs, 2009

2008

Large-scale atomistic approach to random-dopant-induced characteristic variability in nanoscale CMOS digital and high-frequency integrated circuits.

Yiming Li, Chih-Hong Hwang, Ta-Ching Yeh, Tien-Yeh Li

Proceedings of the 2008 International Conference on Computer-Aided Design, 2008

2007

Numerical Simulation of Static Noise Margin for a Six-Transistor Static Random Access Memory Cell with 32nm Fin-Typed Field Effect Transistors.

Yiming Li, Chih-Hong Hwang, Shao-Ming Yu

Proceedings of the Computational Science - ICCS 2007, 7th International Conference, Beijing, China, May 27, 2007