Chih-Chun Tsai

According to our database, Chih-Chun Tsai authored at least 7 papers between 2009 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Optimal confidence interval for the largest exponential location parameter.

Shun-Yi Chen, Chih-Chun Tsai, Hubert J. Chen, Su-Hao Lee

Commun. Stat. Simul. Comput., 2022

2021

Lamination Scheme of Curing Degree at Multiple Levels of Temperature With Location-Scale Regression.

Chih-Chun Tsai, Chien-Tai Lin, Narayanaswamy Balakrishnan

IEEE Access, 2021

2015

Optimal Design for Accelerated-Stress Acceptance Test Based on Wiener Process.

Chih-Chun Tsai, Chien-Tai Lin, Narayanaswamy Balakrishnan

IEEE Trans. Reliab., 2015

Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model.

Chih-Chun Tsai, Chien-Tai Lin

IEEE Trans. Reliab., 2015

2012

Optimal Design for Degradation Tests Based on Gamma Processes With Random Effects.

Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan

IEEE Trans. Reliab., 2012

2011

Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process.

Chih-Chun Tsai, Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan

IEEE Trans. Reliab., 2011

2009

Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes.

Sheng-Tsaing Tseng, Narayanaswamy Balakrishnan, Chih-Chun Tsai

IEEE Trans. Reliab., 2009