Chia-Yu Hsu
Orcid: 0000-0002-8923-1213
According to our database1,
Chia-Yu Hsu
authored at least 66 papers
between 2006 and 2024.
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Bibliography
2024
Segment Anything Model Can Not Segment Anything: Assessing AI Foundation Model's Generalizability in Permafrost Mapping.
Remote. Sens., March, 2024
Designing data-informed support for building learning habits in the Japanese K12 context.
Res. Pract. Technol. Enhanc. Learn., 2024
Int. J. Prod. Res., 2024
Geospatial foundation models for image analysis: evaluating and enhancing NASA-IBM Prithvi's domain adaptability.
CoRR, 2024
Tradeoffs among Action Taking Policies Matter in Active Sequential Multi-Hypothesis Testing: the Optimal Error Exponent Region.
CoRR, 2024
CoRR, 2024
On the Optimal Tradeoffs among Error Exponents in Active Sequential Multiple Hypothesis Testing.
Proceedings of the IEEE International Symposium on Information Theory, 2024
Evaluating Productivity of Learning Habits Using Math Learning Logs: Do K12 Learners Manage Their Time Effectively?
Proceedings of the Technology Enhanced Learning for Inclusive and Equitable Quality Education, 2024
2023
Supporting "time awareness" in self-regulated learning: How do students allocate time during exam preparation?
Smart Learn. Environ., December, 2023
Virtual metrology of material removal rate using a one-dimensional convolutional neural network-based bidirectional long short-term memory network with attention.
Comput. Ind. Eng., December, 2023
Correction to: GeoImageNet: a multi-source natural feature benchmark dataset for GeoAI and supervised machine learning.
GeoInformatica, July, 2023
GeoImageNet: a multi-source natural feature benchmark dataset for GeoAI and supervised machine learning.
GeoInformatica, July, 2023
Explainable GeoAI: can saliency maps help interpret artificial intelligence's learning process? An empirical study on natural feature detection.
Int. J. Geogr. Inf. Sci., 2023
Assessment of IBM and NASA's geospatial foundation model in flood inundation mapping.
CoRR, 2023
Real-time GeoAI for High-resolution Mapping and Segmentation of Arctic Permafrost Features.
CoRR, 2023
Proceedings of the 6th ACM SIGSPATIAL International Workshop on AI for Geographic Knowledge Discovery, 2023
2022
Key Feature Identification for Monitoring Wafer-to-Wafer Variation in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng., 2022
Ensemble convolutional neural networks with weighted majority for wafer bin map pattern classification.
J. Intell. Manuf., 2022
GeoAI for Large-Scale Image Analysis and Machine Vision: Recent Progress of Artificial Intelligence in Geography.
ISPRS Int. J. Geo Inf., 2022
Second-Ordered Parametric Duality for the Multi-Objective Programming Problem in Complex Space.
Axioms, 2022
On Universal Sequential Classification from Sequentially Observed Empirical Statistics.
Proceedings of the IEEE Information Theory Workshop, 2022
Real-time GeoAI for high-resolution mapping and segmentation of arctic permafrost features: the case of ice-wedge polygons.
Proceedings of the 5th ACM SIGSPATIAL International Workshop on AI for Geographic Knowledge Discovery, 2022
Extensive Reading at Home: Extracting Self-directed Reading Habits from Learning Logs.
Proceedings of the Artificial Intelligence in Education - 23rd International Conference, 2022
2021
A New Double Exponentially Weighted Moving Average Run-to-Run Control Using a Disturbance-Accumulating Strategy for Mixed-Product Mode.
IEEE Trans Autom. Sci. Eng., 2021
Knowledge-Driven GeoAI: Integrating Spatial Knowledge into Multi-Scale Deep Learning for Mars Crater Detection.
Remote. Sens., 2021
Multiple time-series convolutional neural network for fault detection and diagnosis and empirical study in semiconductor manufacturing.
J. Intell. Manuf., 2021
Rating prediction based on combination of review mining and user preference analysis.
Inf. Syst., 2021
L-measure evaluation metric for fake information detection models with binary class imbalance.
Enterp. Inf. Syst., 2021
2020
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing.
IEEE Trans Autom. Sci. Eng., 2020
Automated terrain feature identification from remote sensing imagery: a deep learning approach.
Int. J. Geogr. Inf. Sci., 2020
Similarity matching of wafer bin maps for manufacturing intelligence to empower Industry 3.5 for semiconductor manufacturing.
Comput. Ind. Eng., 2020
A two-phase non-dominated sorting particle swarm optimization for chip feature design to improve wafer exposure effectiveness.
Comput. Ind. Eng., 2020
Corrigendum to "Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes" [Adv. Eng. Informat. 46 (2020) 101166].
Adv. Eng. Informatics, 2020
Defective wafer detection using a denoising autoencoder for semiconductor manufacturing processes.
Adv. Eng. Informatics, 2020
Proceedings of the Cross-Cultural Design. Applications in Health, Learning, Communication, and Creativity, 2020
Learning from Counting: Leveraging Temporal Classification for Weakly Supervised Object Localization and Detection.
Proceedings of the 31st British Machine Vision Conference 2020, 2020
2019
QoS-guaranteed User Association and Resource Allocation with CoMP JT in Ultra-Dense Networks.
Proceedings of the 20th Asia-Pacific Network Operations and Management Symposium, 2019
2018
Int. J. Comput. Intell. Syst., 2018
Agent-based fuzzy constraint-directed negotiation for service level agreements in cloud computing.
Clust. Comput., 2018
Foreword: Smart manufacturing, innovative product and service design to empower Industry 4.0.
Comput. Ind. Eng., 2018
Proceedings of the Universal Access in Human-Computer Interaction. Virtual, Augmented, and Intelligent Environments, 2018
2017
Data mining for enhanced driving effectiveness: an eco-driving behaviour analysis model for better driving decisions.
Int. J. Prod. Res., 2017
Periodically Pulsed Immunotherapy in a Mathematical Model of Tumor, CD4<sup>+</sup> T Cells, and Antitumor Cytokine Interactions.
Comput. Math. Methods Medicine, 2017
Recognizing terrain features on terrestrial surface using a deep learning model: an example with crater detection.
Proceedings of the 1st Workshop on Artificial Intelligence and Deep Learning for Geographic Knowledge Discovery, 2017
2016
Test-Retest Reliability of an Automated Infrared-Assisted Trunk Accelerometer-Based Gait Analysis System.
Sensors, 2016
A genetic algorithm for the multi-objective optimization of mixed-model assembly line based on the mental workload.
Eng. Appl. Artif. Intell., 2016
Agent-based fuzzy constraint-directed negotiation mechanism for distributed job shop scheduling.
Eng. Appl. Artif. Intell., 2016
An agent-based fuzzy constraint-directed negotiation model for solving supply chain planning and scheduling problems.
Appl. Soft Comput., 2016
2015
A novel approach to hedge and compensate the critical dimension variation of the developed-and-etched circuit patterns for yield enhancement in semiconductor manufacturing.
Comput. Oper. Res., 2015
A linkage mining in block-based evolutionary algorithm for permutation flowshop scheduling problem.
Comput. Ind. Eng., 2015
Proceedings of the Asia Pacific Business Process Management, 2015
2014
Overlay Error Compensation Using Advanced Process Control With Dynamically Adjusted Proportional-Integral R2R Controller.
IEEE Trans Autom. Sci. Eng., 2014
Integrated data envelopment analysis and neural network model for forecasting performance of wafer fabrication operations.
J. Intell. Manuf., 2014
Manufacturing intelligence and innovation for digital manufacturing and operational excellence.
J. Intell. Manuf., 2014
A virtual metrology approach for maintenance compensation to improve yield in semiconductor manufacturing.
Int. J. Comput. Intell. Syst., 2014
Proceedings of the 2014 IEEE International Conference on Systems, Man, and Cybernetics, 2014
2013
Overall Wafer Effectiveness (OWE): A novel industry standard for semiconductor ecosystem as a whole.
Comput. Ind. Eng., 2013
2012
J. Intell. Manuf., 2012
2011
UNISON analysis to model and reduce step-and-scan overlay errors for semiconductor manufacturing.
J. Intell. Manuf., 2011
Manufacturing intelligence for determining machine subgroups to enhance yield in semiconductor manufacturning.
Proceedings of the Winter Simulation Conference 2011, 2011
2009
Intelligent controller design with UUB stability using Gaussian wavelet neural networks.
Int. J. Intell. Comput. Cybern., 2009
Expert Syst. Appl., 2009
2008
Proceedings of the IEEE International Conference on Systems, 2008
2006
A novel method for determining machine subgroups and backups with an empirical study for semiconductor manufacturing.
J. Intell. Manuf., 2006