Cheol-Jong Woo
According to our database1,
Cheol-Jong Woo
authored at least 5 papers
between 2009 and 2011.
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Bibliography
2011
Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
J. Electron. Test., 2011
2010
Reducing test time and area overhead of an embedded memory array built-in repair analyzer with optimal repair rate.
Proceedings of the 28th IEEE VLSI Test Symposium, 2010
Proceedings of the 15th European Test Symposium, 2010
Proceedings of the 19th IEEE Asian Test Symposium, 2010
2009
Low-Complexity Off-Chip Skew Measurement and Compensation Module (SMCM) Design for Built-Off Test Chip.
Proceedings of the 14th IEEE European Test Symposium, 2009