Chenjun Guo

Orcid: 0000-0003-4084-3611

According to our database1, Chenjun Guo authored at least 12 papers between 2019 and 2022.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
Distance Effect in Transient Thermography for Internal Defects Detection in Composites.
IEEE Trans. Instrum. Meas., 2022

Health Monitoring of RTV Silicone Rubber Coating on Insulators Based on Multimode Features of Active Infrared Thermography.
IEEE Trans. Instrum. Meas., 2022

Photothermal Radar Shearography: A Novel Transient-Based Speckle Pattern Interferometry for Depth-Tomographic Inspection.
IEEE Trans. Ind. Informatics, 2022

A Semisupervised Learning Framework for Recognition and Classification of Defects in Transient Thermography Detection.
IEEE Trans. Ind. Informatics, 2022

A Review: Application of Terahertz Nondestructive Testing Technology in Electrical Insulation Materials.
IEEE Access, 2022

Porcelain Bushing Internal Defects Intelligent Detection Based on Transient Thermography.
Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, 2022

2021
Pixel-Level Classification of Pollution Severity on Insulators Using Photothermal Radiometry and Multiclass Semisupervised Support Vector Machine.
IEEE Trans. Ind. Informatics, 2021

2020
Remote Optical Thermography Detection Method and System for Silicone Polymer Insulating Materials Used in Power Industry.
IEEE Trans. Instrum. Meas., 2020

Differential Evolution Fitting-Based Optical Step-Phase Thermography for Micrometer Thickness Measurement of Atmospheric Corrosion Layer.
IEEE Trans. Ind. Informatics, 2020

2019
Detecting Defects in Porcelain Postinsulator Coated With Room Temperature Vulcanized Silicone Rubber by Pulsed Thermography.
IEEE Trans. Instrum. Meas., 2019

Testing Method for Composite Insulators Interface Based on Nonlinear Ultrasonic.
IEEE Access, 2019

A Far-Field Evaluation Method for Interfacial Defects Existed in Composite Insulators Based on Transient Thermal Wave.
IEEE Access, 2019


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