Chen-Wei Lin

According to our database1, Chen-Wei Lin authored at least 13 papers between 2008 and 2018.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2018
Enhancing Inter-Node Process Migration for Load Balancing on Linux-Based NUMA Multicore Systems.
Proceedings of the 2018 IEEE 42nd Annual Computer Software and Applications Conference, 2018

2014
Novel Circuit-Level Model for Gate Oxide Short and its Testing Method in SRAMs.
IEEE Trans. Very Large Scale Integr. Syst., 2014

Testing methods for a write-assist disturbance-free dual-port SRAM.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

2013
Fault Models and Test Methods for Subthreshold SRAMs.
IEEE Trans. Computers, 2013

Testing of a low-VMIN data-aware dynamic-supply 8T SRAM.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Investigation of gate oxide short in FinFETs and the test methods for FinFET SRAMs.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013

2012
Testing strategies for a 9T sub-threshold SRAM.
Proceedings of the 2012 IEEE International Test Conference, 2012

2011
A Novel Pixel Design for AM-OLED Displays Using Nanocrystalline Silicon TFTs.
IEEE Trans. Very Large Scale Integr. Syst., 2011

Detecting stability faults in sub-threshold SRAMs.
Proceedings of the 2011 IEEE/ACM International Conference on Computer-Aided Design, 2011

2010
Fault models and test methods for subthreshold SRAMs.
Proceedings of the 2011 IEEE International Test Conference, 2010

Mathematical yield estimation for two-dimensional-redundancy memory arrays.
Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

2009
A Charge-Sensing-Capable Source Driver for TFT Array Testing in System-on-Panel Displays.
J. Comput., 2009

2008
A Built-In TFT Array Charge-Sensing Technique for System-on-Panel Displays.
Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008


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