Chen Liu
Orcid: 0000-0003-3705-1306Affiliations:
- Hebei Semiconductor Research Institute, Metrology Centre, Shijiazhuang, China
Timeline
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Bibliography
2020
Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems.
IEEE Trans. Instrum. Meas., 2020
Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy.
IEEE Trans. Instrum. Meas., 2020