Charles R. Kime

According to our database, Charles R. Kime authored at least 36 papers between 1966 and 1997.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1997

Cellular Automata for Weighted Random Pattern Generation.

Danial J. Neebel, Charles R. Kime

IEEE Trans. Computers, 1997

1996

MFBIST: A BIST Method for Random Pattern Resistant Circuits.

Mohammed F. AlShaibi, Charles R. Kime

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

Partial scan flip-flop selection by use of empirical testability.

Kee Sup Kim, Charles R. Kime

J. Electron. Test., 1995

1994

ICAT: incremental combinational ATPG.

Byung S. So, Charles R. Kime

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

Multiple weighted cellular automata.

Danial J. Neebel, Charles R. Kime

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

Fixed-Biased Pseudorandom Built-In Self-Test for Random-Pattern-Resistant Circuits.

Mohammed F. AlShaibi, Charles R. Kime

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

A fault simulation method: Parallel pattern critical path tracing.

Byung S. So, Charles R. Kime

J. Electron. Test., 1993

A Tutorial on Built-In Self-Test, Part 2: Applications.

Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja

IEEE Des. Test Comput., 1993

A Tutorial on Built-in Self-Test. I. Principles.

Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja

IEEE Des. Test Comput., 1993

Inhomogeneous Cellular Automata for Weighted-Random-Pattern Generation.

Danial J. Neebel, Charles R. Kime

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Partial Scan Using Reverse Direction Empirical Testability.

Kee Sup Kim, Charles R. Kime

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

Test Scheduling in High Performance VLSI System Implementations.

John Y. Sayah, Charles R. Kime

IEEE Trans. Computers, 1992

1990

Computer-aided design of pseudoexhaustive BIST for semiregular circuits.

Chau-Chin Su, Charles R. Kime

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

Multiple path sensitization for hierarchical circuit testing.

Chau-Chin Su, Charles R. Kime

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

Partial Scan by Use of Empirical Testability.

Kee Sup Kim, Charles R. Kime

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 1990

1989

Scheduling unequal length tests in high performance VLSI system implementations.

John Y. Sayah, Charles R. Kime

Proceedings of the Computer Design: VLSI in Computers and Processors, 1989

1988

A concurrent testing technique for digital circuits.

Kewal K. Saluja, Rajiv Sharma, Charles R. Kime

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988

Test Scheduling and Control for VLSI Built-In Self-Test.

Gary L. Craig, Charles R. Kime, Kewal K. Saluja

IEEE Trans. Computers, 1988

Concurrent Off-Phase Built-in Self-Test of Dormant Logic.

Leon J. Sigal, Charles R. Kime

Proceedings of the Proceedings International Test Conference 1988, 1988

Impact of Testability Standards on University Research and Instruction.

Charles R. Kime

Proceedings of the Proceedings International Test Conference 1988, 1988

1985

Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults.

Gary L. Craig, Charles R. Kime

Proceedings of the Proceedings International Test Conference 1985, 1985

1984

Diagnosis in the Presence of Known Faults.

John A. McPherson, Charles R. Kime

IEEE Trans. Computers, 1984

A Built-In Test Methodology for VLSI Data Paths.

Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams

Proceedings of the Proceedings International Test Conference 1984, 1984

1982

WISPAC: A Parallel Array Computer for Simulation Applications.

Vincent C. Rideout, J. Eastman, Adel Said Elmaghraby, Raphael A. Finkel, A. A. Frank, T. J. Kaminsky, Charles R. Kime, John A. McPherson, Michael Jon Redmond, S. Diane Smith

Proceedings of the Parallel and Large-Scale Computers: Performance, 1982

1979

A Two-Level Diagnostic Model for Digital Systems.

John A. McPherson, Charles R. Kime

IEEE Trans. Computers, 1979

An Abstract Model for Digital System Fault Diagnosis.

Charles R. Kime

IEEE Trans. Computers, 1979

1976

A Module-Level Testing Approach for Combinational Networks.

Ramachendra P. Batni, Charles R. Kime

IEEE Trans. Computers, 1976

1975

System Fault Diagnosis: Closure and Diagnosability with Repair.

Jeffrey D. Russell, Charles R. Kime

IEEE Trans. Computers, 1975

System Fault Diagnosis: Masking, Exposure, and Diagnosability Without Repair.

Jeffrey D. Russell, Charles R. Kime

IEEE Trans. Computers, 1975

Comments on "Derivation of Minimal Complete Sets of Test-Input Sequences Using Boolean Differences".

Gernot Metze, Donald R. Schertz, Kilin To, Gordon Whitney, Charles R. Kime, Jeffrey D. Russell

IEEE Trans. Computers, 1975

Fault Tolerant Computing: An Introduction and a Perspective.

Charles R. Kime

IEEE Trans. Computers, 1975

1974

An Efficient Algorithm for Finding an Irredundant Set Cover.

Ramachendra P. Batni, Jeffrey D. Russell, Charles R. Kime

J. ACM, 1974

1972

Improved Procedures for Determining Diagnostic Resolution.

James C. Bassett, Charles R. Kime

IEEE Trans. Computers, 1972

1971

Structural Factors in the Fault Diagnosis of Combinational Networks.

Jeffrey D. Russell, Charles R. Kime

IEEE Trans. Computers, 1971

1970

An Analysis Model for Digital System Diagnosis.

Charles R. Kime

IEEE Trans. Computers, 1970

1966

An organization for checking experiments on sequential circuits.

Charles R. Kime

IEEE Trans. Electron. Comput., 1966