Charles F. Hawkins

According to our database, Charles F. Hawkins authored at least 47 papers between 1985 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths.

Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez

IEEE Des. Test, 2013

2012

Testing of Stuck-Open Faults in Nanometer Technologies.

Víctor H. Champac, Julio Vazquez Hernandez, Salvador Barceló, Roberto Gómez, Chuck Hawkins, Jaume Segura

IEEE Des. Test Comput., 2012

2010

Reliability analysis of small delay defects in vias located in signal paths.

Hector Villacorta, Víctor H. Champac, Chuck Hawkins, Jaume Segura

Proceedings of the 11th Latin American Test Workshop, 2010

2009

Stuck-Open Fault Leakage and Testing in Nanometer Technologies.

Julio César Vázquez, Víctor H. Champac, Chuck Hawkins, Jaume Segura

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

A modern look at the CMOS stuck-open fault.

Roberto Gómez, Víctor H. Champac, Chuck Hawkins, Jaume Segura

Proceedings of the 10th Latin American Test Workshop, 2009

2006

Parametric Failures and Detection Strategies.

Chuck Hawkins

Proceedings of the 7th Latin American Test Workshop, 2006

2005

The anatomy of nanometer timing failures.

Chuck Hawkins, Jaume Segura

Proceedings of the 10th European Test Symposium, 2005

2003

Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ.

Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Vivek De

IEEE Trans. Very Large Scale Integr. Syst., 2003

Burn-in Temperature Projections for Deep Sub-micron Technologies.

Oleg Semenov, Arman Vassighi, Manoj Sachdev, Ali Keshavarzi, Charles F. Hawkins

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

A View from the Bottom: Nanometer Technology AC Parametric Failures -- Why, Where, and How to Detect.

Charles F. Hawkins, Ali Keshavarzi, Jaume Segura

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

CMOS IC nanometer technology failure mechanisms.

Charles F. Hawkins, Ali Keshavarzi, Jaume Segura

Proceedings of the IEEE Custom Integrated Circuits Conference, 2003

2002

Leakage and Process Variation Effects in Current Testing on Future CMOS Circuits.

Ali Keshavarzi, James W. Tschanz, Siva G. Narendra, Vivek De, W. Robert Daasch, Kaushik Roy, Manoj Sachdev, Charles F. Hawkins

IEEE Des. Test Comput., 2002

Parametric Failures in CMOS ICs - A Defect-Based Analysis.

Jaume Segura, Ali Keshavarzi, Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

GHz Testing and Its Fuzzy Targets.

Chuck Hawkins, Jaume Segura

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Charge Based Transient Current Testing (CBT) for Submicron CMOS SRAMs.

Bartomeu Alorda, M. Rosales, Jerry M. Soden, Charles F. Hawkins, Jaume Segura

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Defect Oriented Fault Diagnosis for Semiconductor Memories using Charge Analysis: Theory and Experiments.

Ivan de Paúl, M. Rosales, Bartomeu Alorda, Jaume Segura, Charles F. Hawkins, Jerry M. Soden

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

2000

Intrinsic leakage in deep submicron CMOS ICs-measurement-based test solutions.

Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins

IEEE Trans. Very Large Scale Integr. Syst., 2000

Multiple-parameter CMOS IC testing with increased sensitivity for I_DDQ.

Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins, Manoj Sachdev, Krishnamurthy Soumyanath, Vivek De

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Test and Reliability: Partners in IC Manufacturing, Part 2.

Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin

IEEE Des. Test Comput., 1999

Deep Submicron CMOS Current IC Testing: Is There a Future?

Charles F. Hawkins, Jerry M. Soden

IEEE Des. Test Comput., 1999

Test and Reliability: Partners in IC Manufacturing, Part 1.

Charles F. Hawkins, Jaume Segura

IEEE Des. Test Comput., 1999

Technology scaling behavior of optimum reverse body bias for standby leakage power reduction in CMOS IC's.

Ali Keshavarzi, Siva G. Narendra, Shekhar Borkar, Charles F. Hawkins, Kaushik Roy, Vivek De

Proceedings of the 1999 International Symposium on Low Power Electronics and Design, 1999

1998

CMOS IC reliability indicators and burn-in economics.

Alan W. Righter, Charles F. Hawkins, Jerry M. Soden, Peter C. Maxwell

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

Intrinsic Leakage in Low-Power Deep Submicron CMOS ICs.

Ali Keshavarzi, Kaushik Roy, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

Transient Power Supply Voltage (V_DDT) Analysis for Detecting IC Defects.

Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

A detailed analysis and electrical modeling of gate oxide shorts in MOS transistors.

Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins

J. Electron. Test., 1996

IDDQ Testing: Issues Present and Future.

Jerry M. Soden, Charles F. Hawkins

IEEE Des. Test Comput., 1996

1995

IDDQ Design and Test Advantages Propel Industry.

Charles F. Hawkins, Jerry M. Soden

IEEE Des. Test Comput., 1995

A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level.

Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Defect Classes - An Overdue Paradigm for CMOS IC.

Charles F. Hawkins, Jerry M. Soden, Alan W. Righter, F. Joel Ferguson

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1993

The Economics of Guardband Placement.

Richard H. Williams, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

A General Purpose I_DDQ Measurement Circuit.

Kenneth M. Wallquist, Alan W. Righter, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Quality Testing Requires Quality Thinking.

Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

IDDQ testing: A review.

Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati, Weiwei Mao

J. Electron. Test., 1992

Introduction.

Ravi K. Gulati, Charles F. Hawkins

J. Electron. Test., 1992

Testing Errors: Data and Calculations in an IC Manufacturing Process.

Richard H. Williams, R. Glenn Wagner, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Economic Impact of Type I Test Errors at System and Board Levels.

Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

System Testing: The Future for All of Us.

Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits.

Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

EE Curriculum - Continuous Process Improvement?

Charles F. Hawkins, Richard H. Williams

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Errors in testing.

Richard H. Williams, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

Zero defects or zero stuck-at faults-CMOS IC process improvement with I_DDQ.

Jerry M. Soden, Ronald R. Fritzemeier, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

Increased CMOS IC stuck-at fault coverage with reduced I _DDQ test sets.

Ronald R. Fritzemeier, Jerry M. Soden, R. Keith Treece, Charles F. Hawkins

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990

1989

CMOS IC Stuck-Open Fault Electrical Effects and Design Considerations.

Jerry M. Soden, R. Keith Treece, Michael R. Taylor, Charles F. Hawkins

Proceedings of the Proceedings International Test Conference 1989, 1989

1986

Test Considerations for Gate Oxide Shorts in CMOS ICs.

Jerry M. Soden, Charles F. Hawkins

IEEE Des. Test, 1986

Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs.

Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings International Test Conference 1986, 1986

1985

Electrical Characteristics and Testing Considerations for Gate Oxide Shorts in CMOS ICs.

Jerry M. Soden, Charles F. Hawkins

Proceedings of the Proceedings International Test Conference 1985, 1985