Charles E. Stroud

According to our database, Charles E. Stroud authored at least 63 papers between 1986 and 2011.

Collaborative distances:

• Dijkstra number of three.
• Erdős number of three.

2011

Selective Spectrum Analysis for Analog Measurements.

Jie Qin, Joseph Cali, Bradley F. Dutton, George J. Starr, Fa Foster Dai, Charles E. Stroud

IEEE Trans. Ind. Electron., 2011

2010

On-Line Single Event Upset Detection and Correction in Field Programmable Gate Array Configuration Memories.

Bradley F. Dutton, Charles E. Stroud

Int. J. Comput. Their Appl., 2010

The First Clock Cycle Is A Real BIST.

Charles E. Stroud, Bradley F. Dutton

Proceedings of the 2010 International Conference on Embedded Systems & Applications, 2010

2009

On Built-In Self-Test for Adders.

Mary D. Pulukuri, Charles E. Stroud

J. Electron. Test., 2009

Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems.

George J. Starr, Jie Qin, Bradley F. Dutton, Charles E. Stroud, Foster F. Dai, Victor P. Nelson

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

Soft Core Embedded Processor Based Built-In Self-Test of FPGAs.

Bradley F. Dutton, Charles E. Stroud

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

Application of Embedded Systems in Low Earth Orbit for Measurement of Ionospheric Anomalies.

George J. Starr, J. M. Wersinger, Richard Chapman, Lloyd Riggs, Victor P. Nelson, John Klingelhoeffer, Charles E. Stroud

Proceedings of the 2009 International Conference on Embedded Systems & Applications, 2009

Built-In Self-Test of Embedded SEU Detection Cores in Virtex-4 and Virtex-5 FPGAs.

Bradley F. Dutton, Charles E. Stroud

Proceedings of the 2009 International Conference on Embedded Systems & Applications, 2009

Embedded Processor Based Fault Injection and SEU Emulation for FPGAs.

Bradley F. Dutton, Mustafa Ali, Charles E. Stroud, John Sunwoo

Proceedings of the 2009 International Conference on Embedded Systems & Applications, 2009

Built-in Self-Test for Memory Resources in Virtex-4 Field Programmable Gate Arrays.

Brooks R. Garrison, Daniel T. Milton, Charles E. Stroud

Proceedings of the ISCA 24th International Conference on Computers and Their Applications, 2009

Single Event Upset Detection and Correction in Virtex-4 and Virtex-5 FPGAs.

Bradley F. Dutton, Charles E. Stroud

Proceedings of the ISCA 24th International Conference on Computers and Their Applications, 2009

2008

Logic Testing.

Laung-Terng Wang, Charles E. Stroud, Kwang-Ting (Tim) Cheng

Proceedings of the Wiley Encyclopedia of Computer Science and Engineering, 2008

2007

Online Fault Tolerance for FPGA Logic Blocks.

John Marty Emmert, Charles E. Stroud, Miron Abramovici

IEEE Trans. Very Large Scale Integr. Syst., 2007

FPGA-Based Analog Functional Measurements for Adaptive Control in Mixed-Signal Systems.

Jie Qin, Charles E. Stroud, Fa Foster Dai

IEEE Trans. Ind. Electron., 2007

Noise Figure Measurement Using Mixed-Signal BIST.

Jie Qin, Charles E. Stroud, Foster F. Dai

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2007), 2007

2006

Automatic linearity and frequency response tests with built-in pattern generator and analyzer.

Foster F. Dai, Charles E. Stroud, Dayu Yang

IEEE Trans. Very Large Scale Integr. Syst., 2006

An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults.

Jack R. Smith, Tian Xia, Charles E. Stroud

J. Electron. Test., 2006

Analog frequency response measurement in mixed-signal systems.

Charles E. Stroud, Dayu Yang, Foster F. Dai

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

Embedded Processor Based Built-In Self-Test and Diagnosis of Logic and Memory Resources in FPGAs.

Daniel T. Milton, Sachin Dhingra, Charles E. Stroud

Proceedings of the 2006 International Conference on Embedded Systems & Applications, 2006

An Architecture for Fail-Silent Operation of FPGAs and Configurable SoCs.

Lee Lerner, Charles E. Stroud

Proceedings of the 2006 International Conference on Embedded Systems & Applications, 2006

2005

Built-in self-test for automatic analog frequency response measurement.

Dayu Yang, Foster F. Dai, Charles E. Stroud

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

Built-In Self-Test and Diagnosis of Multiple Embedded Cores in SoCs.

Srinivas M. Garimella, Charles E. Stroud

Proceedings of The 2005 International Conference on Embedded Systems and Applications, 2005

On-Chip BIST-Based Diagnosis of Embedded Programmable Logic Cores in System-on-Chip Devices.

Charles E. Stroud, Srinivas M. Garimella, John Sunwoo

Proceedings of the 20th International Conference on Computers and Their Applications, 2005

2004

Online BIST and BIST-based diagnosis of FPGA logic blocks.

Miron Abramovici, Charles E. Stroud, John Marty Emmert

IEEE Trans. Very Large Scale Integr. Syst., 2004

Built-In Self-Test for System-on-Chip: A Case Study.

Charles E. Stroud, John Sunwoo, Srinivas M. Garimella, Jonathan Harris

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Automatic Linearity (IP3) Test with Built-in Pattern Generator and Analyzer.

Foster F. Dai, Charles E. Stroud, Dayu Yang, Shuying Qi

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

BIST-Based Delay-Fault Testing in FPGAs.

Miron Abramovici, Charles E. Stroud

J. Electron. Test., 2003

BIST for Xilinx 4000 and Spartan Series FPGAs: A Case Study.

Charles E. Stroud, Keshia N. Leach, Thomas A. Slaughter

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

BIST-Based Diagnosis of FPGA Interconnect.

Charles E. Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Using embedded FPGAs for SoC yield improvement.

Miron Abramovici, Charles E. Stroud, John Marty Emmert

Proceedings of the 39th Design Automation Conference, 2002

2001

BIST-based test and diagnosis of FPGA logic blocks.

Miron Abramovici, Charles E. Stroud

IEEE Trans. Very Large Scale Integr. Syst., 2001

Analog and Mixed Signal Benchmark Circuit Development: Who Needs Them?

Henry Chang, Steve Dollens, Gordon W. Roberts, Charles E. Stroud, Mani Soma, Jacob A. Abraham

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

On-Line BIST and Diagnosis of FPGA Interconnect Using Roving STARs.

Miron Abramovici, Charles E. Stroud, Matthew Lashinsky, Jeremy Nall, John Marty Emmert

Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001

Roving Stars: An Integrated Approach To On-Line Testing, Diagnosis, And Fault Tolerance For Fpgas In Adaptive Computing Systems.

Miron Abramovici, John Marty Emmert, Charles E. Stroud

Proceedings of the 3rd NASA / DoD Workshop on Evolvable Hardware (EH 2001), 2001

On-Line Fault Tolerance for FPGA Interconnect with Roving STARs.

John Marty Emmert, Stanley Baumgart, Pankaj Kataria, Andrew M. Taylor, Charles E. Stroud, Miron Abramovici

Proceedings of the 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 2001

2000

A New Method for Testing Re-Programmable PLAs.

Charles E. Stroud, James R. Bailey, Johan R. Emmert

J. Electron. Test., 2000

Bridging fault extraction from physical design data for manufacturing test development.

Charles E. Stroud, John Marty Emmert, John R. Bailey, Khushru S. Chhor, Dragan Nikolic

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

DIST-based detection and diagnosis of multiple faults in FPGAs.

Miron Abramovici, Charles E. Stroud

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

Improving On-Line BIST-Based Diagnosis for Roving STARs.

Miron Abramovici, Charles E. Stroud, Brandon Skaggs, John Marty Emmert

Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

Performance Penalty for Fault Tolerance in Roving STARs.

John Marty Emmert, Charles E. Stroud, Jason A. Cheatham, Andrew M. Taylor, Pankaj Kataria, Miron Abramovici

Proceedings of the Field-Programmable Logic and Applications, 2000

Dynamic Fault Tolerance in FPGAs via Partial Reconfiguration.

John Marty Emmert, Charles E. Stroud, Brandon Skaggs, Miron Abramovici

Proceedings of the 8th IEEE Symposium on Field-Programmable Custom Computing Machines (FCCM 2000), 2000

1999

Enhanced Bist-Based Diagnosis of FPGAs via Boundary Scan Access.

Carter Hamilton, Gretchen Gibson, Sajitha Wijesuriya, Charles E. Stroud

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications.

Miron Abramovici, Charles E. Stroud, Carter Hamilton, Sajitha Wijesuriya, Vinay Verma

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Applying Built-In Self-Test to Majority Voting Fault Tolerant Circuits.

Charles E. Stroud, Joe K. Tannehill Jr.

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Built-in self-test of FPGA interconnect.

Charles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1997

BIST-Based Diagnostics of FPGA Logic Blocks.

Charles E. Stroud, Eric Lee, Miron Abramovici

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

A Parameterized VHDL Library for On-Line Testing.

Charles E. Stroud, M. Ding, S. Seshadri, Ramesh Karri, I. Kim, Subhajit Roy, S. Wu

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!).

Charles E. Stroud, Srinivasa Konala, Ping Chen, Miron Abramovici

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

Using ILA Testing for BIST in FPGAs.

Charles E. Stroud, Eric Lee, Srinivasa Konala, Miron Abramovici

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

Evaluation of FPGA Resources for Built-In Self-Test of Programmable Logic Blocks.

Charles E. Stroud, Ping Chen, Srinivasa Konala, Miron Abramovici

Proceedings of the 1996 Fourth International Symposium on Field Programmable Gate Arrays, 1996

1995

Multiple error detection and identification via signature analysis.

T. Raju Damarla, Charles E. Stroud, Avinash Sathaye

J. Electron. Test., 1995

Improving the efficiency of error identification via signature analysis.

Charles E. Stroud, T. Raju Damarla

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

A built-in self test scheme for VLSI.

T. Raju Damarla, Wei Su, Gerald T. Michael, Moon J. Chung, Charles E. Stroud

Proceedings of the 1995 Conference on Asia Pacific Design Automation, Makuhari, Massa, Chiba, Japan, August 29, 1995

1994

Reliability of majority voting based VLSI fault-tolerant circuits.

Charles E. Stroud

IEEE Trans. Very Large Scale Integr. Syst., 1994

1993

Testability and test generation for majority voting fault-tolerant circuits.

Charles E. Stroud, Ahmed E. Barbour

J. Electron. Test., 1993

1991

Distractions in Design for Testability and Built-Is Self-Test.

Charles E. Stroud

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

Built-In Self-Test for High-Speed Data-Path Circuitry.

Charles E. Stroud

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Parallel Processing and Hardware Acceleration for Synthesis of VLSI Devices from Behavioral Models.

Charles E. Stroud, Ahmed E. Barbour

Proceedings of the 1990 International Conference on Parallel Processing, 1990

1989

Design for Testability and Test Generation for Static Redundancy System Level Fault-Tolerant Circuits.

Charles E. Stroud, Ahmed E. Barbour

Proceedings of the Proceedings International Test Conference 1989, 1989

1988

Behavioral model synthesis with Cones.

Charles E. Stroud, Ronald R. Munoz, David A. Pierce

IEEE Des. Test, 1988

Automated BIST for sequential logic synthesis.

Charles E. Stroud

IEEE Des. Test, 1988

An Automated BIST Approach for General Sequential Logic Synthesis.

Charles E. Stroud

Proceedings of the 25th ACM/IEEE Conference on Design Automation, 1988

1986

Built-in Self Testing of Embedded Memories.

Sunil K. Jain, Charles E. Stroud

IEEE Des. Test, 1986