Charles E. Radke

According to our database, Charles E. Radke authored at least 11 papers between 1965 and 1991.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1991

Delay Test Effectiveness Evaluation of LSSD-Based VLSI Vogic Circuits.

David M. Wu, Charles E. Radke

Proceedings of the 28th Design Automation Conference, 1991

1986

Statistical AC Test Coverage.

David M. Wu, Charles E. Radke, J. Paul Roth

Proceedings of the Proceedings International Test Conference 1986, 1986

Performance Assurance of Memories Embedded in VLSI Chips.

E. Kofi Vida-Torku, James A. Monzel, Charles E. Radke

Proceedings of the Proceedings International Test Conference 1986, 1986

1984

Improve Yield and Quality Through Testability Analysis of VLSI Circuits.

David M. Wu, Charles E. Radke, C. C. Beh

Proceedings of the Proceedings International Test Conference 1984, 1984

1983

Quality level and fault coverage for multichip modules.

E. Kofi Vida-Torku, Charles E. Radke

Proceedings of the 20th Design Automation Conference, 1983

1982

Do Stuck Fault Models Reflect Manufacturing Defects?

C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku

Proceedings of the Proceedings International Test Conference 1982, 1982

1970

The use of quadratic residue research.

Charles E. Radke

Commun. ACM, 1970

1969

A justification of, and an improvement on, a useful rule for predicting circuit-to-pin ratios.

Charles E. Radke

Proceedings of the 6th annual Design Automation Conference, 1969

1966

Necessary and Sufficient Conditions on Conditional Probabilities to Maximize Entropy

Charles E. Radke

Inf. Control., June, 1966

Merge-Sort Analysis by Matrix Techniques.

Charles E. Radke

IBM Syst. J., 1966

1965

Enumeration of Strongly Connected Sequential Machines

Charles E. Radke

Inf. Control., August, 1965