Chaoming Zhang

According to our database, Chaoming Zhang authored at least 9 papers between 2007 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2019

A Broadband CMOS RF Front End for Direct Sampling Satellite Receivers.

Jie Fang, Chaoming Zhang, Frank Singor, Jacob A. Abraham

IEEE J. Solid State Circuits, 2019

Commutation Failure Prediction Method Considering Commutation Voltage Distortion and DC Current Variation.

Qi Wang, Chaoming Zhang, Xingquan Wu, Yi Tang

IEEE Access, 2019

2017

A 5-GS/s 10-b 76-mW Time-Interleaved SAR ADC in 28 nm CMOS.

Jie Fang, Shankar Thirunakkarasu, Xuefeng Yu, Fabian Silva-Rivas, Chaoming Zhang, Frank Singor, Jacob A. Abraham

IEEE Trans. Circuits Syst. I Regul. Pap., 2017

2015

Derivative-free active-RC elliptic filter using cascade of biquads in 28 nm CMOS.

Shankar Thirunakkarasu, Frank Singor, Jie Fang, Sivakumar Ganesan, Jose Fabian Silva-Rivas, Kannan Deenadayalan, Bharath Kumar Thandri, Chaoming Zhang, Xuefeng Yu, Nand Jha, Ardie G. Venes

Proceedings of the IEEE 58th International Midwest Symposium on Circuits and Systems, 2015

A 5GS/s 10b 76mW time-interleaved SAR ADC in 28nm CMOS.

Jie Fang, Shankar Thirunakkarasu, Xuefeng Yu, Fabian Silva-Rivas, Kwang Young Kim, Chaoming Zhang, Frank Singor

Proceedings of the 2015 IEEE Custom Integrated Circuits Conference, 2015

2012

Built-in Self Test of RF Subsystems with Integrated Detectors.

Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham

J. Electron. Test., 2012

2009

On-Line Calibration and Power Optimization of RF Systems Using a Built-In Detector.

Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2008

Low Cost RF Receiver Parameter Measurement with On-Chip Amplitude Detectors.

Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

2007

Built-In Test of RF Mixers Using RF Amplitude Detectors.

Chaoming Zhang, Ranjit Gharpurey, Jacob A. Abraham

Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007