Chaohui He

According to our database, Chaohui He authored at least 10 papers between 2015 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Single-event multiple transients in guard-ring hardened inverter chains of different layout designs.

Wen Zhao, Chaohui He, Wei Chen, Rongmei Chen, Peitian Cong, Fengqi Zhang, Zujun Wang, Chen Shen, Lisang Zheng, Xiaoqiang Guo, Lili Ding

Microelectron. Reliab., 2018

Investigation of enhanced low dose rate sensitivity in SiGe HBTs by ⁶⁰Co γ irradiation under different biases.

Jinxin Zhang, Qi Guo, Hongxia Guo, Wu Lu, Chaohui He, Xin Wang, Pei Li, Lin Wen

Microelectron. Reliab., 2018

FFI4SoC: a Fine-Grained Fault Injection Framework for Assessing Reliability against Soft Error in SoC.

Xiaozhi Du, Dongyang Luo, Kailun Shi, Chaohui He, Shuhuan Liu

J. Electron. Test., 2018

A Fine-Grained Software-Implemented DMA Fault Tolerance for SoC Against Soft Error.

Xiaozhi Du, Dongyang Luo, Chaohui He, Shuhuan Liu

J. Electron. Test., 2018

2017

Single event effects sensitivity of low energy proton in Xilinx Zynq-7010 system-on chip.

Xuecheng Du, Shuhuan Liu, Dongyang Luo, Yao Zhang, Xiaozhi Du, Chaohui He, Xiaotang Ren, Weitao Yang, Yuan Yuan

Microelectron. Reliab., 2017

Heavy ion micro-beam study of single-event transient (SET) in SiGe heterjunction bipolar transistor.

Jinxin Zhang, Hongxia Guo, Fengqi Zhang, Chaohui He, Pei Li, Yunyi Yan, Hui Wang, Linxia Zhang

Sci. China Inf. Sci., 2017

2016

Time dependent modeling of single particle displacement damage in silicon devices.

Du Tang, Ignacio Martin-Bragado, Chaohui He, Hang Zang, Cen Xiong, Yonghong Li, Daxi Guo, Peng Zhang, Jinxin Zhang

Microelectron. Reliab., 2016

2015

3-D simulation study of single event effects of SiGe heterojunction bipolar transistor in extreme environment.

Jinxin Zhang, Chaohui He, Hongxia Guo, Du Tang, Cen Xiong, Pei Li, Xin Wang

Microelectron. Reliab., 2015

Hot carrier effect on a single SiGe HBT's EMI response.

Cen Xiong, Yonghong Li, Shuhuan Liu, Du Tang, Jinxin Zhang, Chaohui He

Microelectron. Reliab., 2015

Hot carrier effect on the bipolar transistors' response to electromagnetic interference.

Cen Xiong, Shuhuan Liu, Yonghong Li, Du Tang, Jinxin Zhang, Xuecheng Du, Chaohui He

Microelectron. Reliab., 2015