Chao-Yang Ke
Orcid: 0009-0003-4651-666X
According to our database1,
Chao-Yang Ke
authored at least 2 papers
between 2020 and 2023.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2023
Investigation of Safe Operating Area on 4H-SiC 600V VDMOSFET with TLP and UIS Test Methods.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2020
Over-Voltage Protection on the CC Pin of USB Type-C Interface against Electrical Overstress Events.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020