Changsoo Jang

According to our database, Changsoo Jang authored at least 3 papers between 2006 and 2010.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2010

Forward-stepwise regression analysis for fine leak batch testing of wafer-level hermetic MEMS packages.

Changsoo Jang, Byeng Dong Youn, Ping F. Wang, Bongtae Han, Suk-Jin Ham

Microelectron. Reliab., 2010

2008

Failure analysis of contact probe pins for SnPb and Sn applications.

Changsoo Jang, Seungbae Park, Bill Infantolino, Lawrence Lehman, Ryan Morgan, Dipak Sengupta

Microelectron. Reliab., 2008

2006

A numerical failure analysis on lead breakage issues of ultra fine pitch flip chip-on-flex and tape carrier packages during chip/film assembly process.

Changsoo Jang, Seongyoung Han, Hangyu Kim, Sayoon Kang

Microelectron. Reliab., 2006