Chang Liu

According to our database, Chang Liu authored at least 9 papers between 2013 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Using Programmable Delay Monitors for Wear-Out and Early Life Failure Prediction.

Chang Liu, Eric Schneider, Hans-Joachim Wunderlich

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Built-In Test for Hidden Delay Faults.

Matthias Kampmann, Michael A. Kochte, Chang Liu, Eric Schneider, Sybille Hellebrand, Hans-Joachim Wunderlich

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

2018

Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.

Chang Liu, Eric Schneider, Matthias Kampmann, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the 27th IEEE Asian Test Symposium, 2018

2017

Improvement of hardware reliability with aging monitors.

Chang Liu

PhD thesis, 2017

Aging monitor reuse for small delay fault testing.

Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2015

Efficient observation point selection for aging monitoring.

Chang Liu, Michael A. Kochte, Hans-Joachim Wunderlich

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

On-line prediction of NBTI-induced aging rates.

Rafal Baranowski, Farshad Firouzi, Saman Kiamehr, Chang Liu, Mehdi Baradaran Tahoori, Hans-Joachim Wunderlich

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

FAST-BIST: Faster-than-at-Speed BIST targeting hidden delay defects.

Sybille Hellebrand, Thomas Indlekofer, Matthias Kampmann, Michael A. Kochte, Chang Liu, Hans-Joachim Wunderlich

Proceedings of the 2014 International Test Conference, 2014

2013

Synthesis of workload monitors for on-line stress prediction.

Rafal Baranowski, Alejandro Cook, Michael E. Imhof, Chang Liu, Hans-Joachim Wunderlich

Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013