Chandramouli N. Amarnath

Orcid: 0000-0001-9938-2157

According to our database1, Chandramouli N. Amarnath authored at least 26 papers between 2020 and 2024.

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Bibliography

2024
Error Resilience in Deep Neural Networks Using Neuron Gradient Statistics.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., April, 2024

LARS-VSA: A Vector Symbolic Architecture For Learning with Abstract Rules.
CoRR, 2024

A Novel Hyperdimensional Computing Framework for Online Time Series Forecasting on the Edge.
CoRR, 2024

Error Resilient Hyperdimensional Computing Using Hypervector Encoding and Cross-Clustering.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

ADARE-HD: Adaptive-Resolution Framework for Efficient Object Detection and Tracking via HD-Computing.
Proceedings of the 67th IEEE International Midwest Symposium on Circuits and Systems, 2024

Testing and Tuning of RRAM-Based DNNs: A Machine Learning-Assisted Approach.
Proceedings of the 67th IEEE International Midwest Symposium on Circuits and Systems, 2024

DeepER-HD: An Error Resilient HyperDimensional Computing Framework with DNN Front-End for Feature Selection.
Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Efficient Optimized Testing of Resistive RAM Based Convolutional Neural Networks.
Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024

Post-Manufacture Criticality-Aware Gain Tuning of Timing Encoded Spiking Neural Networks for Yield Recovery.
Proceedings of the IEEE European Test Symposium, 2024

AMS Test Stimulus Generation and Response Analysis Using Hyperdimensional Clustering: Minimizing Misclassification Rate.
Proceedings of the IEEE European Test Symposium, 2024

Learning Assisted Post-Manufacture Testing and Tuning of RRAM-Based DNNs for Yield Recovery.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

Signature Driven Post-Manufacture Testing and Tuning of RRAM Spiking Neural Networks for Yield Recovery.
Proceedings of the 29th Asia and South Pacific Design Automation Conference, 2024

2023
Error Resilient Neuromorphic Systems Using Embedded Predictive Neuron Checks.
Proceedings of the 24th IEEE Latin American Test Symposium, 2023

OATT: Outlier Oriented Alternative Testing and Post-Manufacture Tuning of Mixed-Signal/RF Circuits and Systems.
Proceedings of the IEEE International Test Conference, 2023

Secure Control Loop Execution of Cyber-Physical Devices Using Predictive State Space Checks.
Proceedings of the 24th International Symposium on Quality Electronic Design, 2023

A Novel Approach to Error Resilience in Online Reinforcement Learning.
Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

A Resilience Framework for Synapse Weight Errors and Firing Threshold Perturbations in RRAM Spiking Neural Networks.
Proceedings of the IEEE European Test Symposium, 2023

Error Resilient Transformers: A Novel Soft Error Vulnerability Guided Approach to Error Checking and Suppression.
Proceedings of the IEEE European Test Symposium, 2023

2022
Low Power Neural Network Accelerators Using Collaborative Weight Tuning and Shared Shift-Add optimization.
Proceedings of the 65th IEEE International Midwest Symposium on Circuits and Systems, 2022

Efficient Low Cost Alternative Testing of Analog Crossbar Arrays for Deep Neural Networks.
Proceedings of the IEEE International Test Conference, 2022

Soft Error Resilient Deep Learning Systems Using Neuron Gradient Statistics.
Proceedings of the 28th IEEE International Symposium on On-Line Testing and Robust System Design, 2022

2021
TESDA: Transform Enabled Statistical Detection of Attacks in Deep Neural Networks.
CoRR, 2021

Hierarchical Failure Modeling and Machine Learning Assisted Correction of Electro-Mechanical Subsystem Failures in Autonomous Vehicles.
Proceedings of the IEEE International Test Conference, 2021

Addressing Soft Error and Security Threats in DNNs Using Learning Driven Algorithmic Checks.
Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

2020
Concurrent Error Detection in Embedded Digital Control of Nonlinear Autonomous Systems Using Adaptive State Space Checks.
Proceedings of the IEEE International Test Conference, 2020

Encoded Check Driven Concurrent Error Detection in Particle Filters for Nonlinear State Estimation.
Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020


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