Chandra Tirumurti

According to our database, Chandra Tirumurti authored at least 20 papers between 2003 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2017

Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST.

Martin Omaña, Daniele Rossi, Filippo Fuzzi, Cecilia Metra, Chandra Tirumurti, Rajesh Galivanche

IEEE Trans. Very Large Scale Integr. Syst., 2017

2016

Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST.

Martin Omaña, Daniele Rossi, Edda Beniamino, Cecilia Metra, Chandrasekharan Tirumurti, Rajesh Galivanche

IEEE Trans. Computers, 2016

2015

Revisiting Vulnerability Analysis in Modern Microprocessors.

Michail Maniatakos, Maria K. Michael, Chandra Tirumurti, Yiorgos Makris

IEEE Trans. Computers, 2015

2014

Power droop reduction during Launch-On-Shift scan-based logic BIST.

Martin Omaña, Daniele Rossi, Edda Beniamino, Cecilia Metra, Chandra Tirumurti, Rajesh Galivanche

Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

2013

On the Impact of Performance Faults in Modern Microprocessors.

Naghmeh Karimi, Michail Maniatakos, Chandrasekharan Tirumurti, Yiorgos Makris

J. Electron. Test., 2013

Novel approach to reduce power droop during scan-based logic BIST.

Martin Omaña, Daniele Rossi, Filippo Fuzzi, Cecilia Metra, Chandra Tirumurti, R. Galivache

Proceedings of the 18th IEEE European Test Symposium, 2013

2012

Functional Test-Sequence Grading at Register-Transfer Level.

Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti

IEEE Trans. Very Large Scale Integr. Syst., 2012

Global Signal Vulnerability (GSV) Analysis for Selective State Element Hardening in Modern Microprocessors.

Michail Maniatakos, Chandrasekharan Tirumurti, Rajesh Galivanche, Yiorgos Makris

IEEE Trans. Computers, 2012

2011

Instruction-Level Impact Analysis of Low-Level Faults in a Modern Microprocessor Controller.

Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris

IEEE Trans. Computers, 2011

Workload-Cognizant Concurrent Error Detection in the Scheduler of a Modern Microprocessor.

Naghmeh Karimi, Michail Maniatakos, Abhijit Jas, Chandra Tirumurti, Yiorgos Makris

IEEE Trans. Computers, 2011

AVF Analysis Acceleration via Hierarchical Fault Pruning.

Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris

Proceedings of the 16th European Test Symposium, 2011

2010

Low cost and low intrusive approach to test on-line the scheduler of high performance microprocessors.

Daniele Rossi, Martin Omaña, Gianluca Berghella, Cecilia Metra, Abhijit Jas, Chandra Tirumurti, Rajesh Galivanche

Proceedings of the 7th Conference on Computing Frontiers, 2010

2009

Instruction-Level Impact Comparison of RT- vs. Gate-Level Faults in a Modern Microprocessor Controller.

Michail Maniatakos, Naghmeh Karimi, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

RT-Level Deviation-Based Grading of Functional Test Sequences.

Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Impact analysis of performance faults in modern microprocessors.

Naghmeh Karimi, Michail Maniatakos, Chandra Tirumurti, Abhijit Jas, Yiorgos Makris

Proceedings of the 27th International Conference on Computer Design, 2009

2008

Design and Evaluation of a Timestamp-Based Concurrent Error Detection Method (CED) in a Modern Microprocessor Controller.

Michail Maniatakos, Naghmeh Karimi, Yiorgos Makris, Abhijit Jas, Chandra Tirumurti

Proceedings of the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 2008

2007

Estimating Error Propagation Probabilities with Bounded Variances.

Hossein Asadi, Mehdi Baradaran Tahoori, Chandra Tirumurti

Proceedings of the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007), 2007

2005

On modeling crosstalk faults.

Sandip Kundu, Sujit T. Zachariah, Yi-Shing Chang, Chandra Tirumurti

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

2004

A Modeling Approach for Addressing Power Supply Switching Noise Related Failures of Integrated Circuit.

Chandra Tirumurti, Sandip Kundu, Susmita Sur-Kolay, Yi-Shing Chang

Proceedings of the 2004 Design, 2004

2003

On Modeling Cross-Talk Faults.

Sujit T. Zachariah, Yi-Shing Chang, Sandip Kundu, Chandra Tirumurti

Proceedings of the 2003 Design, 2003