Cemil Cem Gürsoy

According to our database, Cemil Cem Gürsoy authored at least 12 papers between 2015 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2022

On BTI Aging Rejuvenation in Memory Address Decoders.

Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

2021

Modeling Soft-Error Reliability Under Variability.

Aneesh Balakrishnan, Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Said Hamdioui, Maksim Jenihhin, Dan Alexandrescu

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2020

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs.

Guilherme Cardoso Medeiros, Cemil Cem Gürsoy, Lizhou Wu, Moritz Fieback, Maksim Jenihhin, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

High-Level Combined Deterministic and Pseudoexhuastive Test Generation for RISC Processors.

Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik

CoRR, 2019

On NBTI-induced Aging Analysis in IEEE 1687 Reconfigurable Scan Networks.

Aleksa Damljanovic, Giovanni Squillero, Cemil Cem Gürsoy, Maksim Jenihhin

Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019

Mixed-level identification of fault redundancy in microprocessors.

Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik

Proceedings of the IEEE Latin American Test Symposium, 2019

Software-Based Mitigation for Memory Address Decoder Aging.

Daniel H. P. Kraak, Cemil Cem Gürsoy, Innocent O. Agbo, Mottaqiallah Taouil, Maksim Jenihhin, Jaan Raik, Said Hamdioui

Proceedings of the IEEE Latin American Test Symposium, 2019

High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors.

Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Cemil Cem Gürsoy, Jaan Raik

Proceedings of the 24th IEEE European Test Symposium, 2019

New categories of Safe Faults in a processor-based Embedded System.

Cemil Cem Gürsoy, Maksim Jenihhin, Adeboye Stephen Oyeniran, Davide Piumatti, Jaan Raik, Matteo Sonza Reorda, Raimund Ubar

Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019

2016

Erratum to: Speeding Up Logic Locking via Fault Emulation and Dynamic Multiple Fault Injection.

Sezer Gören, Cemil Cem Gürsoy, Abdullah Yildiz

J. Electron. Test., 2016

On optimization of multi-cycle tests for test quality and application time.

Cemil Cem Gürsoy, Abdullah Yildiz, Sezer Gören

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

2015

Speeding Up Logic Locking via Fault Emulation and Dynamic Multiple Fault Injection.

Sezer Gören, Cemil Cem Gürsoy, Abdullah Yildiz

J. Electron. Test., 2015