Cathryn Christiansen

According to our database, Cathryn Christiansen authored at least 6 papers between 2006 and 2018.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2018

New insight on TDDB area scaling methodology of non-Poisson systems.

Tian Shen, Kong Boon Yeap, Sean P. Ogden, Cathryn Christiansen, Patrick Justison

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Electromigration characteristics of power grid like structures.

Baozhen Li, Andrew Kim, Paul McLaughlin, Barry P. Linder, Cathryn Christiansen

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Effect of metal line width on electromigration of BEOL Cu interconnects.

Seungman Choi, Cathryn Christiansen, Linjun Cao, James Zhang, Ronald Filippi, Tian Shen, Kong Boon Yeap, Sean P. Ogden, Haojun Zhang, Bianzhu Fu, Patrick Justison

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

Diagnostic electromigration reliability evaluation with a local sensing structure.

Fen Chen, Erik McCullen, Cathryn Christiansen, Michael A. Shinosky, Roger Dufresne, Prakash Periasamy, Rick Kontra, Carole Graas, Gary StOnge

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Electromigration challenges for advanced on-chip Cu interconnects.

Baozhen Li, Cathryn Christiansen, Dinesh Badami, Chih-Chao Yang

Microelectron. Reliab., 2014

2006

Application of three-parameter lognormal distribution in EM data analysis.

Baozhen Li, Emmanuel Yashchin, Cathryn Christiansen, Jason Gill, Ronald Filippi, Timothy D. Sullivan

Microelectron. Reliab., 2006