Carol Pyron

According to our database, Carol Pyron authored at least 13 papers between 1989 and 2003.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2003

Automated Test Model Generation from Switch Level Custom Circuits.

Magdy S. Abadir, Jing Zeng, Carol Pyron, Juhong Zhu

Proceedings of the 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China, 2003

An automated method for test model generation from switch level circuits.

Tim McDougall, Atanas N. Parashkevov, Simon Jolly, Juhong Zhu, Jing Zeng, Carol Pyron, Magdy S. Abadir

Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

2002

Silicon Symptoms to Solutions: Applying Design for Debug Techniques.

Carol Pyron, Rekha Bangalore, Dawit Belete, Jason Goertz, Ashutosh Razdan, Denise Younger

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Scan and BIST Can Almost Achieve Test Quality Levels.

Carol Pyron

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits.

John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2000

At-Speed Testing of Delay Faults for Motorola's MPC7400, a PowerPC(tm) Microprocessor.

Nandu Tendolkar, Robert F. Molyneaux, Carol Pyron, Rajesh Raina

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

1999

DFT advances in the Motorola's MPC7400, a PowerPC G4 microprocessor.

Carol Pyron, Mike Alexander, James Golab, George Joos, Bruce Long, Robert F. Molyneaux, Rajesh Raina, Nandu Tendolkar

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

Test Strategy for the PowerPC 750 Microprocessor.

Carol Pyron, Javier Prado, James Golab

IEEE Des. Test Comput., 1998

1997

Next-Generation PowerPC^TM Microprocessor Test Strategy Improvements.

Carol Pyron, Javier Prado, James Golab

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1995

Implementing 1149.1 in the PowerPC^TM RISC Microprocessor Family.

Carol Pyron, William C. Bruce

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1992

EDIF Test - The Upcoming Standard for Test Data Transfers.

Michael G. Wahl, Carol Pyron

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

Representing Boundary Scan Tests with the EDIF Test View.

Carol Pyron

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1989

CAE Functionality for Verification of Diagnostic Programs.

Carol Pyron, Rex Sallade

Proceedings of the Proceedings International Test Conference 1989, 1989