Carlo Floresca

According to our database, Carlo Floresca authored at least 1 paper in 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

Physical degradation of GaN HEMT devices under high drain bias reliability testing.

S. Y. Park, Carlo Floresca, Uttiya Chowdhury, Jose L. Jimenez, Cathy Lee, Edward Beam, Paul Saunier, Tony Balistreri, Moon J. Kim

Microelectron. Reliab., 2009