Carlo Cazzaniga

According to our database, Carlo Cazzaniga authored at least 19 papers between 2017 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2024

Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation.

Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Ruiqi Ye, John Goodacre, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga, Chris Frost

IEEE Trans. Reliab., March, 2024

Neutron Beam Evaluation of Probabilistic Data Structure-based Online Checkers.

Bruno Forlin, Edian B. Annink, Elijah Cishugi, Carlo Cazzaniga, Paolo Rech, Gerard K. Rauwerda, Gianluca Furano, Marco Ottavi

Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024

2023

Irradiation Tests for Commercial Off-the Shelf Components with Atmospheric-like Neutrons and Heavy-Ions.

Paolo Branchini, Andrea Fabbri, Sacha Cormenier, Marco Bernardini, Giovanni Romanelli, Enrico Preziosi, Roberto Senesi, Carla Andreani, Chris Frost, Carlo Cazzaniga, Toni Fabio Catalano, Mario Buffardo

CoRR, 2023

An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds?

Bruno E. Forlin, Wouter van Huffelen, Carlo Cazzaniga, Paolo Rech, Nikolaos Alachiotis, Marco Ottavi

Proceedings of the IEEE European Test Symposium, 2023

Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs.

Kevin Böhmer, Bruno Forlin, Carlo Cazzaniga, Paolo Rech, Gianluca Furano, Nikolaos Alachiotis, Marco Ottavi

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2022

Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks.

Lucas Matana Luza, Annachiara Ruospo, Daniel Söderström, Carlo Cazzaniga, Maria Kastriotou, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo

IEEE Trans. Emerg. Top. Comput., 2022

Evaluation of Xilinx Deep Learning Processing Unit under Neutron Irradiation.

Dimitris Agiakatsikas, Nikos Foutris, Aitzan Sari, Vasileios Vlagkoulis, Ioanna Souvatzoglou, Mihalis Psarakis, Mikel Luján, Maria Kastriotou, Carlo Cazzaniga

CoRR, 2022

Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip.

Douglas A. dos Santos, André Martins Pio de Mattos, Lucas M. Luza, Carlo Cazzaniga, Maria Kastriotou, Douglas R. Melo, Luigi Dilillo

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Thermal neutrons: a possible threat for supercomputer reliability.

Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Andrea Favalli, Opale Schappert, Stephen Wender, Carlo Cazzaniga, Christopher Frost, Paolo Rech

J. Supercomput., 2021

First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics.

Carlo Cazzaniga, Marta Bagatin, Simone Gerardin, Alessandra Costantino, Christopher D. Frost

IEEE Trans. Emerg. Top. Comput., 2021

Experimental Findings on the Sources of Detected Unrecoverable Errors in GPUs.

Fernando Fernandes dos Santos, Sujit Malde, Carlo Cazzaniga, Christopher Frost, Luigi Carro, Paolo Rech

CoRR, 2021

Characterization of a RISC-V System-on-Chip under Neutron Radiation.

Douglas A. dos Santos, Lucas M. Luza, Maria Kastriotou, Carlo Cazzaniga, Cesar A. Zeferino, Douglas R. Melo, Luigi Dilillo

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study.

Lucas Matana Luza, Daniel Söderström, André Martins Pio de Mattos, Eduardo Augusto Bezerra, Carlo Cazzaniga, Maria Kastriotou, Christian Poivey, Luigi Dilillo

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

2020

Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node.

Lyuan Xu, Jingchen Cao, John Brockman, Carlo Cazzaniga, Christopher Frost, Shi-Jie Wen, Rita Fung, Bharat L. Bhuva

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Thermal Neutrons: a Possible Threat for Supercomputers and Safety Critical Applications.

Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fernando Fernandes dos Santos, Gabriel Piscoya Dávila, Philippe O. A. Navaux, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech

Proceedings of the IEEE European Test Symposium, 2020

An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices.

Daniel Oliveira, Sean Blanchard, Nathan DeBardeleben, Fermando Santos, Gabriel Piscoya Dávila, Philippe Olivier Alexandre Navaux, Stephen Wender, Carlo Cazzaniga, Christopher Frost, Robert C. Baumann, Paolo Rech

Proceedings of the 50th Annual IEEE-IFIP International Conference on Dependable Systems and Networks, 2020

Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems.

Lucas Matana Luza, Daniel Söderström, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga, Ernesto Sánchez, Alberto Bosio, Luigi Dilillo

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2018

Setup and experimental results analysis of COTS Camera and SRAMs at the ISIS neutron facility.

Marco Ottavi, Dario Asciolla, Tiziano Fiorucci, Elena Grosso, Carla Marzullo, Alessandro Scaramella, Simone Stramaccioni, Alessia Zibecchi, Carla Andreani, Gian Carlo Cardarilli, Carlo Cazzaniga, Luca Di Nunzio, Rocco Fazzolari, Marco Re, Pedro Reviriego, Gianluca Furano, Roberto Senesi

Proceedings of the 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2018

2017

High-energy neutrons characterization of a safety critical computing system.

Andrea Fedi, Marco Ottavi, Gianluca Furano, Antimo Bruno, Roberto Senesi, Carla Andreani, Carlo Cazzaniga

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2017