Canhui Zhan

According to our database, Canhui Zhan authored at least 5 papers between 2015 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation.

Tinghuan Chen, Qi Sun, Canhui Zhan, Changze Liu, Huatao Yu, Bei Yu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2021

Analog IC Aging-induced Degradation Estimation via Heterogeneous Graph Convolutional Networks.

Tinghuan Chen, Qi Sun, Canhui Zhan, Changze Liu, Huatao Yu, Bei Yu

Proceedings of the ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, 2021

2018

New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology.

Pengpeng Ren, Changze Liu, Sanping Wan, Jiayang Zhang, Zhuoqing Yu, Nie Liu, Yongsheng Sun, Runsheng Wang, Canhui Zhan, Zhenghao Gan, Waisum Wong, Yu Xia, Ru Huang

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Placement mitigation techniques for power grid electromigration.

Wei Ye, Yibo Lin, Xiaoqing Xu, Wuxi Li, Yiwei Fu, Yongsheng Sun, Canhui Zhan, David Z. Pan

Proceedings of the 2017 IEEE/ACM International Symposium on Low Power Electronics and Design, 2017

2015

Localized thermal effect of sub-16nm FinFET technologies and its impact on circuit reliability designs and methodologies.

Yongsheng Sun, Canhui Zhan, Jianping Guo, Yiwei Fu, Guangming Li, Jun Xia

Proceedings of the IEEE International Reliability Physics Symposium, 2015