Campbell Millar
According to our database1,
Campbell Millar
authored at least 24 papers
between 2007 and 2018.
Collaborative distances:
Collaborative distances:
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Bibliography
2018
Proceedings of the 2018 Design, Automation & Test in Europe Conference & Exhibition, 2018
2017
Proceedings of the 2017 International Symposium on VLSI Design, Automation and Test, 2017
2015
Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015
2014
Microelectron. Reliab., 2014
Accurate simulations of the interplay between process and statistical variability for nanoscale FinFET-based SRAM cell stability.
Proceedings of the 44th European Solid State Device Research Conference, 2014
2013
Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology.
IEEE Des. Test, 2013
Proceedings of the 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013), 2013
Evaluating the accuracy of SRAM margin simulation through large scale Monte-Carlo simulations with accurate compact models.
Proceedings of 2013 International Conference on IC Design & Technology, 2013
Impact of statistical variability and charge trapping on 14 nm SOI FinFET SRAM cell stability.
Proceedings of the European Solid-State Device Research Conference, 2013
Proceedings of the European Solid-State Device Research Conference, 2013
2012
Statistical variability in 14-nm node SOI FinFETs and its impact on corresponding 6T-SRAM cell design.
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
2011
Genet. Program. Evolvable Mach., 2011
Modelling circuit performance variations due to statistical variability: Monte Carlo static timing analysis.
Proceedings of the Design, Automation and Test in Europe, 2011
2010
IEEE Des. Test Comput., 2010
Proceedings of the Design, Automation and Test in Europe, 2010
Proceedings of the IEEE Custom Integrated Circuits Conference, 2010
2009
Proceedings of the Large-Scale Scientific Computing, 7th International Conference, 2009
2008
Statistical simulation of random dopant induced threshold voltage fluctuations for 35 nm channel length MOSFET.
Microelectron. Reliab., 2008
Proceedings of the IEEE International Symposium on Parallel and Distributed Processing with Applications, 2008
Proceedings of the Computational Science, 2008
Proceedings of the Fourth International Conference on e-Science, 2008
2007
Proceedings of the Third International Conference on e-Science and Grid Computing, 2007