Camille Leurquin
According to our database1,
Camille Leurquin
authored at least 3 papers
between 2022 and 2023.
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Bibliography
2023
Reliability of GaN MOSc-HEMTs: From TDDB to Threshold Voltage Instabilities (Invited).
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Novel High Voltage Bias Temperature Instabilities (HV-BTI) setup to monitor RON/VTH drift on GaN-on-Si E-mode MOSc-HEMTs under drain voltage.
Proceedings of the IEEE International Reliability Physics Symposium, 2022