Cam Lu

According to our database, Cam Lu authored at least 2 papers between 2003 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2004

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.

Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs.

Brady Benware, Robert Madge, Cam Lu, W. Robert Daasch

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003