Calvin Chow

According to our database, Calvin Chow authored at least 7 papers between 2002 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Silicon-correlated Simulation Methodology of EM Side-channel Leakage Analysis.

Kazuki Monta, Lang Lin, Jimin Wen, Harsh Shrivastav, Calvin Chow, Hua Chen, Joao Geada, Sreeja Chowdhury, Nitin Pundir, Norman Chang, Makoto Nagata

ACM J. Emerg. Technol. Comput. Syst., January, 2023

2022

Layout-level Vulnerability Ranking from Electromagnetic Fault Injection.

Lang Lin, Jimin Wen, Harsh Shrivastav, Weike Li, Hua Chen, Gang Ni, Sreeja Chowdhury, Calvin Chow, Norman Chang

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2022

2021

Multiphysics Simulation of EM Side-Channels from Silicon Backside with ML-based Auto-POI Identification.

Lang Lin, Deqi Zhu, Jimin Wen, Hua Chen, Yu Lu, Norman Chang, Calvin Chow, Harsh Shrivastav, Chia-Wei Chen, Kazuki Monta, Makoto Nagata

Proceedings of the IEEE International Symposium on Hardware Oriented Security and Trust, 2021

ML-augmented Methodology for Fast Thermal Side-channel Emission Analysis.

Norman Chang, Deqi Zhu, Lang Lin, Dinesh Selvakumaran, Jimin Wen, Stephen H. Pan, Wenbo Xia, Hua Chen, Calvin Chow, Gary Chen

Proceedings of the ASPDAC '21: 26th Asia and South Pacific Design Automation Conference, 2021

2020

Fast and Comprehensive Simulation Methodology for Layout-Based Power-Noise Side-Channel Leakage Analysis.

Lang Lin, Dinesh Selvakumaran, Deqi Zhu, Norman Chang, Calvin Chow, Makoto Nagata, Kazuki Monta

Proceedings of the IEEE International Symposium on Smart Electronic Systems, 2020

2012

Chip-package power delivery network resonance analysis and co-design using time and frequency domain analysis techniques.

Jonathan Watkins, Jai Pollayil, Calvin Chow, Aveek Sarkar

Proceedings of the Thirteenth International Symposium on Quality Electronic Design, 2012

2002

Parzen-Window Network Intrusion Detectors.

Dit-Yan Yeung, Calvin Chow

Proceedings of the 16th International Conference on Pattern Recognition, 2002