Calvin Chao
Orcid: 0000-0002-1495-576X
According to our database1,
Calvin Chao
authored at least 10 papers
between 2014 and 2023.
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Collaborative distances:
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Bibliography
2023
Random Telegraph Noise Degradation Caused by Hot Carrier Injection in a 0.8 μm-Pitch 8.3Mpixel Stacked CMOS Image Sensor.
Sensors, September, 2023
2021
Session 7 Overview: Imagers and Range Sensors Imagers, Medical, Mems and Displays Subcommittee.
Proceedings of the IEEE International Solid-State Circuits Conference, 2021
Proceedings of the International Conference on IC Design and Technology, 2021
2019
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors.
Sensors, 2019
2018
A 0.66e<sub>rms</sub><sup>-</sup> Temporal-Readout-Noise 3-D-Stacked CMOS Image Sensor With Conditional Correlated Multiple Sampling Technique.
IEEE J. Solid State Circuits, 2018
A 1.1μm-Pitch 13.5Mpixel 3D-stacked CMOS image sensor featuring 230fps full-high-definition and 514fps high-definition videos by reading 2 or 3 rows simultaneously using a column-switching matrix.
Proceedings of the 2018 IEEE International Solid-State Circuits Conference, 2018
2017
Statistical Analysis of the Random Telegraph Noise in a 1.1 μm Pixel, 8.3 MP CMOS Image Sensor Using On-Chip Time Constant Extraction Method.
Sensors, 2017
2016
Proceedings of the 2016 IEEE International Solid-State Circuits Conference, 2016
2015
A 0.66e<sup>-</sup>rms temporal-readout-noise 3D-stacked CMOS image sensor with conditional correlated multiple sampling (CCMS) technique.
Proceedings of the Symposium on VLSI Circuits, 2015
2014
Proceedings of the Symposium on VLSI Circuits, 2014