C. W. Eng

According to our database, C. W. Eng authored at least 3 papers between 2008 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2022

A Deeper Understanding of Well Charging Reliability with Circuit Relevant Test Structures.

T. L. Tan, C. W. Eng, H. Xu, J. M. Soon, E. Ebard, Mahesh Siddabathula, B. F. Phoong, K. H. Poh, M. Prabhu, X.-L. Zhao, J. M. Koo, K. Cho, G.-W. Zhang

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2008

A study of the linearity between I_on and log I_off of modern MOS transistors and its application to stress engineering.

W. S. Lau, Peizhen Yang, C. W. Eng, V. Ho, C. H. Loh, S. Y. Siah, D. Vigar, L. Chan

Microelectron. Reliab., 2008

Anomalous narrow width effect in p-channel metal-oxide-semiconductor surface channel transistors using shallow trench isolation technology.

W. S. Lau, K. S. See, C. W. Eng, W. K. Aw, Kang-Hyun Jo, K. C. Tee, James Y. M. Lee, Elgin K. B. Quek, H. S. Kim, Simon T. H. Chan, L. Chan

Microelectron. Reliab., 2008