C. Trapes

According to our database, C. Trapes authored at least 2 papers between 2003 and 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2005

Experimental extraction of degradation parameters after constant voltage stress and substrate hot electron injection on ultrathin oxides.

C. Trapes, Didier Goguenheim, Alain Bravaix

Microelectron. Reliab., 2005

2003

Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide CMOS technologies.

Alain Bravaix, C. Trapes, Didier Goguenheim, Nathalie Revil, E. Vincent

Microelectron. Reliab., 2003