C. S. Teng
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Bibliography
1993
Characterization of Transistor Mismatch for Statistical CAD of Submicron CMOS Analog Circuits.
Proceedings of the 1993 IEEE International Symposium on Circuits and Systems, 1993
A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits.
Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993