C. Olk

According to our database, C. Olk authored at least 2 papers between 2014 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

A fWLR test structure and method for device reliability monitoring using product relevant circuits.

Rolf-Peter Vollertsen, Georg Georgakos, K. Kölpin, C. Olk

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

HCS degradation of 5 nm oxide high-voltage PLDMOS.

C. Olk, Stefano Aresu, R. Rudolf, M. Röhner, Wolfgang Gustin, E. Stein Von Kamienski

Microelectron. Reliab., 2014