C. Jungemann

According to our database1, C. Jungemann authored at least 3 papers between 2001 and 2011.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Article 
PhD thesis 
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Links

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Bibliography

2011
An analytical approach for physical modeling of hot-carrier induced degradation.
Microelectron. Reliab., 2011

2010
Interface traps density-of-states as a vital component for hot-carrier degradation modeling.
Microelectron. Reliab., 2010

2001
Investigation of the Local Force Approximation in Numerical Device Simulation by Full-band Monte Carlo Simulation.
VLSI Design, 2001


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