C. C. Chiu

According to our database, C. C. Chiu authored at least 5 papers between 1994 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

Study of a new electromigration failure mechanism by novel test structure.

L. D. Chen, B. L. Lin, M.-H. Hsieh, C. W. Chang, J. S. Tsai, J. C. Peng, C. C. Chiu, Y.-H. Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2015

An investigation of capacitance aging model for extreme low-k and high-k dielectrics.

M. N. Chang, Y.-H. Lee, S. Y. Lee, C. C. Chiu, D. Maji, K. Wu

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Thermal behavior of self-heating effect in FinFET devices acting on back-end interconnects.

C. W. Chang, S. E. Liu, B. L. Lin, C. C. Chiu, Y.-H. Lee, K. Wu

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2007

Reliability of interfacial adhesion in a multi-level copper/low-k interconnect structure.

C. C. Chiu, H. H. Chang, Chang-Chun Lee, C. C. Hsia, Kuo-Ning Chiang

Microelectron. Reliab., 2007

1994

A Decoding Strategy Using Graph Partitioning for Continuous-Speech Recognition.

John R. Deller Jr., C. C. Chiu, Y. P. Yang

Proceedings of the 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30, 1994