C. C. Beh

According to our database, C. C. Beh authored at least 2 papers between 1982 and 1984.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1984

Improve Yield and Quality Through Testability Analysis of VLSI Circuits.

David M. Wu, Charles E. Radke, C. C. Beh

Proceedings of the Proceedings International Test Conference 1984, 1984

1982

Do Stuck Fault Models Reflect Manufacturing Defects?

C. C. Beh, K. H. Arya, Charles E. Radke, E. Kofi Vida-Torku

Proceedings of the Proceedings International Test Conference 1982, 1982