C. A. Dimitriadis

According to our database, C. A. Dimitriadis authored at least 21 papers between 2003 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2016

Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators.

Ioannis Messaris, Theano A. Karatsori, Nikolaos Fasarakis, Christoforos G. Theodorou, Spiros Nikolaidis, Gérard Ghibaudo, C. A. Dimitriadis

Microelectron. Reliab., 2016

A comprehensive analysis of nanoscale single- and multi-gate MOSFETs.

Rupendra Kumar Sharma, Charalambos A. Dimitriadis, Matthias Bucher

Microelectron. J., 2016

Noise-induced dynamic variability in nano-scale CMOS SRAM cells.

Christoforos G. Theodorou, Mouenes Fadlallah, Xavier Garros, Charalambos A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 46th European Solid-State Device Research Conference, 2016

Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs.

R. Lavieville, Theano A. Karatsori, Christoforos G. Theodorou, Sylvain Barraud, C. A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 46th European Solid-State Device Research Conference, 2016

2015

New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs.

Christoforos G. Theodorou, Eleftherios G. Ioannidis, Sébastien Haendler, Nicolas Planes, Emmanuel Josse, Charalambos A. Dimitriadis, Gérard Ghibaudo

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Variability of nanoscale triple gate FinFETs: Prediction and analysis method.

Dimitrios H. Tassis, Ioannis Messaris, Nikolaos Fasarakis, Andreas Tsormpatzoglou, Spiros Nikolaidis, C. A. Dimitriadis

Proceedings of the 21st IEEE International Conference on Electronics, Circuits and Systems, 2014

2012

Compact modeling for the transcapacitances of undoped or lightly doped nanoscale cylindrical surrounding gate MOSFETs.

Nikolaos Fasarakis, Andreas Tsormpatzoglou, Dimitrios H. Tassis, Konstantinos Papathanasiou, C. A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012

Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs.

Christoforos G. Theodorou, Eleftherios G. Ioannidis, Sébastien Haendler, Nicolas Planes, Franck Arnaud, Jalal Jomaah, Charalambos A. Dimitriadis, Gérard Ghibaudo

Proceedings of the 2012 European Solid-State Device Research Conference, 2012

2011

Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors.

N. A. Hastas, N. Arpatzanis, C. A. Dimitriadis, Julien Brochet, François Templier, G. Kamarinos

Microelectron. Reliab., 2011

2010

Characteristics of double-gate polycrystalline silicon thin-film transistors for AMOLED pixel design.

Ilias Pappas, Dimitrios H. Tassis, Stilianos Siskos, Charalambos A. Dimitriadis

Proceedings of the 17th IEEE International Conference on Electronics, 2010

2009

A new linear voltage-to-current converter with threshold voltage compensation for analog circuits applications in polycrystalline silicon TFT process.

Ilias Pappas, Christoforos G. Theodorou, Stylianos Siskos, Charalambos A. Dimitriadis

Proceedings of the 16th IEEE International Conference on Electronics, 2009

2008

A Fast and Compact Analog Buffer Design for Active Matrix Liquid Crystal Displays Using Polysilicon Thin-Film Transistors.

Ilias Pappas, Stilianos Siskos, Charalambos A. Dimitriadis

IEEE Trans. Circuits Syst. II Express Briefs, 2008

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress.

N. Arpatzanis, Argyrios T. Hatzopoulos, Dimitrios H. Tassis, C. A. Dimitriadis, François Templier, Maher Oudwan, G. Kamarinos

Microelectron. Reliab., 2008

2006

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors.

Dimitrios H. Tassis, Argyrios T. Hatzopoulos, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos

Microelectron. Reliab., 2006

Effects of hot carriers in offset gated polysilicon thin-film transistors.

Argyrios T. Hatzopoulos, Dimitrios H. Tassis, N. Arpatzanis, C. A. Dimitriadis, G. Kamarinos

Microelectron. Reliab., 2006

Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region.

Nikolaos P. Papadopoulos, Alkis A. Hatzopoulos, Dimitris K. Papakostas, C. A. Dimitriadis, Stilianos Siskos

Microelectron. J., 2006

A threshold voltage variation cancellation technique for analogue peripheral circuits of a display array using poly-Si TFTs.

Ilias Pappas, Lazaros Nalpantidis, Vasilios Kalenteridis, Stilianos Siskos, Alkis A. Hatzopoulos, C. A. Dimitriadis

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

2005

Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors.

N. A. Hastas, N. Archontas, C. A. Dimitriadis, G. Kamarinos, T. Nikolaidis, N. Georgoulas, Adonios Thanailakis

Microelectron. Reliab., 2005

Built-in current sensor with reduced voltage drop using thin-film transistors.

Alkis A. Hatzopoulos, Stelios Siskos, Charalambos A. Dimitriadis, Nikolaos P. Papadopoulos

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

2003

Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors.

N. A. Hastas, C. A. Dimitriadis, F. V. Farmakis, G. Kamarinos

Microelectron. Reliab., 2003

Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors.

N. A. Hastas, C. A. Dimitriadis, J. Brini, G. Kamarinos, V. K. Gueorguiev, S. Kaschieva

Microelectron. Reliab., 2003