Byungjin Chung

According to our database, Byungjin Chung authored at least 12 papers between 2014 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2024

Comprehensive Study of SER in FDSOI-Planar: 28 nm to 18 nm Scaling Effect and Temperature Dependence.

Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2024

Soft-Error Sensitivity in SRAM Manufactured by Bulk Gate-All-Around (GAA) Technology.

Taiki Uemura, Byungjin Chung, Jaehee Choi, Seungbae Lee, Shin-Young Chung, Yuchul Hwang, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Impact of Design and Process on Alpha-Induced SER in 4 nm Bulk-FinFET SRAM.

Taiki Uemura, Byungjin Chung, Shin-Young Chung, Seungbae Lee, Yuchul Hwang, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Accelerator-Based Thermal-Neutron Beam by Compact and Low-Cost Moderator for Soft-Error Evaluation in Semiconductor Devices.

Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Thermal-Neutron SER Mitigation by Cobalt-Contact in 7 nm Bulk-FinFET Technology.

Taiki Uemura, Byungjin Chung, Jegon Kim, Hyewon Shim, Shin-Young Chung, Brandon Lee, Jaehee Choi, Shota Ohnishi, Ken Machida

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology.

Taiki Uemura, Byungjin Chung, Jeongmin Jo, Mijoung Kim, Dalhee Lee, Gunrae Kim, Seungbae Lee, Taesjoong Song, Hwasung Rhee, Brandon Lee, Jaehee Choi

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Bi-Sequential Video Error Concealment Method Using Adaptive Homography-Based Registration.

Byungjin Chung, Changhoon Yim

IEEE Trans. Circuits Syst. Video Technol., 2020

Investigating of SER in 28 nm FDSOI-Planar and Comparing with SER in Bulk-FinFET.

Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Youngin Park, Kiil Hong, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Backside Alpha-Irradiation Test in Flip-Chip Package in EUV 7 nm FinFET SRAM.

Taiki Uemura, Byungjin Chung, Jeongmin Jo, Hai Jiang, Yongsung Ji, Tae-Young Jeong, Rakesh Ranjan, Seungbae Lee, Hwasung Rhee, Sangwoo Pae, Euncheol Lee, Jaehee Choi, Shota Ohnishi, Ken Machida

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Super-Resolution Convolutional Neural Networks Using Modified and Bilateral ReLU.

Hyeongyeom Ahn, Byungjin Chung, Changhoon Yim

Proceedings of the International Conference on Electronics, Information, and Communication, 2019

2018

Fast intra prediction method by adaptive number of candidate modes for RDO in HEVC.

Byungjin Chung, Changhoon Yim

Inf. Process. Lett., 2018

2014

Hybrid error concealment method combining exemplar-based image inpainting and spatial interpolation.

Byungjin Chung, Changhoon Yim

Signal Process. Image Commun., 2014