Byungchoul Park

Orcid: 0000-0002-5905-0964

According to our database1, Byungchoul Park authored at least 10 papers between 2017 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2024
A Highly Digital 143.2-dB DR Sub-1° Phase Error Impedance Monitoring IC With Pulsewidth Modulation Frontend.
IEEE J. Solid State Circuits, April, 2024

A 7.2inch 5.5Mpixel 600mW SPAD X-Ray Detector with 116.7 dB Dynamic Range.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

A 30fps 64×64 CMOS Flash LiDAR Sensor with Push-Pull Analog Counter Achieving 0.1% Depth Uncertainty at 70m Detection Range.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

2023
A 113.3-dB Dynamic Range 600 Frames/s SPAD X-Ray Detector With Seamless Global Shutter and Time-Encoded Extrapolation Counter.
IEEE J. Solid State Circuits, November, 2023

A 400 × 200 600fps 117.7dB-DR SPAD X-Ray Detector with Seamless Global Shutter and Time-Encoded Extrapolation Counter.
Proceedings of the IEEE International Solid- State Circuits Conference, 2023

2021
A 64 × 64 SPAD-Based Indirect Time-of-Flight Image Sensor With 2-Tap Analog Pulse Counters.
IEEE J. Solid State Circuits, 2021

2020
A 640 $\times$ 640 Fully Dynamic CMOS Image Sensor for Always-On Operation.
IEEE J. Solid State Circuits, 2020

2019
A 64×64 APD-Based ToF Image Sensor with Background Light Suppression up to 200 klx Using In-Pixel Auto-Zeroing and Chopping.
Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019

A 640×640 Fully Dynamic CMOS Image Sensor for Always-On Object Recognition.
Proceedings of the 2019 Symposium on VLSI Circuits, Kyoto, Japan, June 9-14, 2019, 2019

2017
Structure variation effects on device reliability of single photon avalanche diodes.
Microelectron. Reliab., 2017


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